Nick BARRETT

Service de Physique de l’état Condensé – SPEC – UMR 3680 CEA-CNRS

Laboratoire d’études des nanostructures et d’imagerie de surface (LENSIS)

Tél. : +33 1 69 08 32 72
Email :

Function

• Research Director
• Head of the research team; Laboratoire d’études des nanostructures et d’imagerie de surface (LENSIS)

Research topics

• Oxide band structure, and particularly development of a method to go beyond the free-electron approximation for the final state
• Surface and interface chemistry
• Study of nano-structured ceramics and nano-objects.

The development of nanospectroscopic imaging with photoelectron emission microscopes (XPEEM) is the central instrumental project. XPEEM provides access to spectroscopic information:

• work function
• chemical state
• density of states
• band structure with ~100 nm lateral resolution

As a result, this technique is perfectly suited to the non-destructive spectroscopic analysis of patterns and objects on the scale of technological devices. To this end, sustained work is being carried out on a number of instrumental developments: various excitation sources for imaging under laboratory conditions; different contrast modes; energy-filtered imaging in direct and reciprocal space.

Finally, an ambitious project has been launched to define a spherical aberration corrector for the electrostatic column, in collaboration with IFF-9 (Jülich Research Center).

Recent publications within the HAL-CEA open science basis.

• Thickness-Dependent Polarization of Strained BiFeO3 Films with Constant Tetragonality,
  J. E. Rault, W. Ren, S. Prosandeev, S. Lisenkov, D. Sando, S. Fusil, M. Bibes, A. Barthélémy, L. Bellaiche, and N. Barrett, Physical Review Letters 109, 267601 (2012)
• Polarization dependent chemistry of ferroelectric BaTiO3(001) domains,
  Y. Mi, G. Geneste, J. E. Rault, C. Mathieu, A. Pancotti and N. Barrett, Journal of physics. Condensed matter: an Institute of Physics journal 24, 275901 (2012)
• Expanding the view into complex material systems: From micro-ARPES to nanoscale HAXPES,
  C. M. Schneider, C. Wiemann, M. Patt, V. Feyer, L. Plucinski, I. P. Krug, M. Escher, N. Weber, M. Merkel, O. Renault, N. Barrett, Journal of Electron Spectroscopy and Related Phenomena 185, 330-339 (2012)
• Dark field photoelectron emission microscopy of micron scale few layer graphene,
  N. Barrett, E.H. Conrad, K. Winkler, B. Krömker, The Review of Scientific Instruments 83, 083706 (2012)
• Chemistry and Atomic Distortion at the Surface of an Epitaxial BaTiO3 Thin Film after Dissociative Adsorption of Water,
  J. L. Wang, F. Gaillard, A. Pancotti, B. Gautier, G. Niu, B. Vilquin, V. Pillard, G. L. M. P. Rodrigues, and N. Barrett, Journal of Physical Chemistry C 116, 21802-21809 (2012)
• Screening of ferroelectric domains on BaTiO3(001) surface by ultraviolet photo-induced charge and dissociative water adsorption,
  J. L. Wang, B. Vilquin and N. Barrett Applied Physics Letters 101, 092902 (2012)
• Electrical and physical topography in energy-filtered photoelectron emission microscopy of two-dimensional silicon pn junctions,
  M. Lavayssière, N. Barrett, M. Escher, O. Renault, Journal of Electron Spectroscopy and Related Phenomena Accepted (2013)
• Full Field electron spectromicroscopy applied to ferroelectric materials,
  N. Barrett et al, Journal of Applied Physics, accepted (2013)
• Interface Electronic Structure in a Metal/Ferroelectric Heterostructure under Applied Bias,
  J. E. Rault, G. Agnus, T. Maroutian, V. Pillard, Ph. Lecoeur, G. Niu, B. Vilquin, M. G. Silly, A. Bendounan, F. Sirotti, and N. Barrett, Physical Review B submitted (2013)
• Laboratory-based real and reciprocal space imaging of the electronic structure of few layer graphene on SiC(000-1) using photoelectron emission microscopy, N. Barrett, K. Winkler, B. Krömker, E.H. Conrad, Ultramicroscopy, submitted (2013)
• X-ray photoelectron diffraction study of relaxation and rumpling of ferroelectric domains in BaTiO3(001),
  A. Pancotti, J. L. Wang, P. Chen, L. Tortech, C.-M. Teodorescu, E. Frantzeskakis, N. Barrett, Physical Review B, submitted (2013)
• Dissociative adsorption of H2O on epitaxially strained, out-of-plane polarized, BaTiO3(001) thin films,
  J. Wang, N. Barrett, F. Gaillard, G. Niu and B. Vilquin, Physical Chemistry Chemical Physics, submitted (2013)
• Thickness-Dependent Polarization of Strained BiFeO3 Films with Constant Tetragonality,
  J. E. Rault, W. Ren, S. Prosandeev, S. Lisenkov, D. Sando, S. Fusil, M. Bibes, A. Barthélémy, L. Bellaiche, and N. Barrett, Physical Review Letters 109, 267601 (2012)
• Polarization dependent chemistry of ferroelectric BaTiO3(001) domains,
  Y. Mi, G. Geneste, J. E. Rault, C. Mathieu, A. Pancotti and N. Barrett, Journal of physics. Condensed matter: an Institute of Physics journal 24, 275901 (2012)
• Expanding the view into complex material systems: From micro-ARPES to nanoscale HAXPES,
  C. M. Schneider, C. Wiemann, M. Patt, V. Feyer, L. Plucinski, I. P. Krug, M. Escher, N. Weber, M. Merkel, O. Renault, N. Barrett, Journal of Electron Spectroscopy and Related Phenomena 185, 330-339 (2012)
• Dark field photoelectron emission microscopy of micron scale few layer graphene,
  N. Barrett, E.H. Conrad, K. Winkler, B. Krömker, The Review of Scientific Instruments 83, 083706 (2012)
• Chemistry and Atomic Distortion at the Surface of an Epitaxial BaTiO3 Thin Film after Dissociative Adsorption of Water,
  J. L. Wang, F. Gaillard, A. Pancotti, B. Gautier, G. Niu, B. Vilquin, V. Pillard, G. L. M. P. Rodrigues, and N. Barrett, Journal of Physical Chemistry C 116, 21802-21809 (2012)
• Screening of ferroelectric domains on BaTiO3(001) surface by ultraviolet photo-induced charge and dissociative water adsorption,
  J. L. Wang, B. Vilquin and N. Barrett Applied Physics Letters 101, 092902 (2012)
• Electrical and physical topography in energy-filtered photoelectron emission microscopy of two-dimensional silicon pn junctions,
  M. Lavayssière, N. Barrett, M. Escher, O. Renault, Journal of Electron Spectroscopy and Related Phenomena Accepted (2013)
• Full Field electron spectromicroscopy applied to ferroelectric materials,
  N. Barrett et al, Journal of Applied Physics, accepted (2013)
• Interface Electronic Structure in a Metal/Ferroelectric Heterostructure under Applied Bias,
  J. E. Rault, G. Agnus, T. Maroutian, V. Pillard, Ph. Lecoeur, G. Niu, B. Vilquin, M. G. Silly, A. Bendounan, F. Sirotti, and N. Barrett, Physical Review B submitted (2013)
• Laboratory-based real and reciprocal space imaging of the electronic structure of few layer graphene on SiC(000-1) using photoelectron emission microscopy,
  N. Barrett, K. Winkler, B. Krömker, E.H. Conrad, Ultramicroscopy, submitted (2013)
• X-ray photoelectron diffraction study of relaxation and rumpling of ferroelectric domains in BaTiO3(001),
  A. Pancotti, J. L. Wang, P. Chen, L. Tortech, C.-M. Teodorescu, E. Frantzeskakis, N. Barrett, Physical Review B, submitted (2013)
• Dissociative adsorption of H2O on epitaxially strained, out-of-plane polarized, BaTiO3(001) thin films,
  J. Wang, N. Barrett, F. Gaillard, G. Niu and B. Vilquin, Physical Chemistry Chemical Physics, submitted (2013)
• Direct observation of Al-doping-induced electronic states in the valence band and band gap of ZnO films
  M. Gabas, P. Torelli, N. Barrett, M. Sacchi, F. Bruneval, Y. Cui, L. Simonelli, P. Diaz-Carrasco, J.R. Ramos Barrado, Phys. Rev. B 84, 153303 (2011)
• Skin Layer of BiFeO3 Single Crystals
  X. Martí, P. Ferrer, J. Herrero-Albillos, J. Narvaez, V. Holy, N. Barrett, M. Alexe, and G. Catalan, Phys. Rev. Lett. 106, 236101 (2011)
• Ferroelectricity in a quasiamorphous ultrathin BaTiO₃ film
  J. L. Wang, A. Pancotti, P. Jégou, G. Niu, B. Gautier, Y.Y. Mi, L. Tortech, S. Yin, B. Vilquin, N. Barrett, Phys. Rev. B 85, 205426 (2011)
• Microscopic correlation between chemical and electronic states in epitaxial graphene on SiC(000-1)
  C. Mathieu, J. Rault, Y. Mi, B. Zhang, W. A. de Heer, C. Berger, E. Conrad, O. Renault, N. Barrett. Phys. Rev. B 83, 235436 (2011)
• Photoemission induced bias in two-dimensional silicon pn junctions
  M. Lavayssière,O. Renault, D. Mariolle, M. Veillerot, J. P. Barnes, J. M. Hartmann, J. Leroy, and N. Barrett Appl. Phys. Lett. 99, 202107 (2011)
• Recent advances in 2D-band structure imaging by k-PEEM and prospects for technological materials
  C. Mathieu, O. Renault, H. Rotella, N. Barrett., A. Chabli. Proc. of FCMN (AIP), 2011.
• Extrinisic screening of ferroelectric domains in Pb(Zr_0.48Ti_0.52)O₃
  I. Krug, N. Barrett, A. Petraru, A. Locatelli, T.O. Mentes, M.A. Niño, K. Rahmanizadeh, G. Bihlmayer, C.M. Schneider, Appl. Phys. Lett. 97, 222903 (2010)
• Applications of high lateral and energy resolution imaging XPS with a double hemispherical analyser based spectromicroscope
  M. Escher, K. Winkler, O. Renault, N. Barrett, J. Electr. Spectr. Relat. Phenom. 178-179 303 (2010)
• Influence of the ferroelectric polarization on the electronic structure of BaTiO₃ thin films
  N. Barrett, J. Rault, I. Krug, B. Vilquin, G. Niu, B. Gautier, D. Albertini, P. Lecoeur, O. Renault Surf. Inter. Anal. (2010). DOI: 10.1002/sia.3369
• Nanoscale surface chemistry of individual Si nanowires by energy-filtered XPEEM
  O. Renault, A. Bailly, L. –F. Zagonel and N. Barrett
• Surface enhanced covalency and Madelung potentials in Nb doped SrTiO₃ (100), (110) and (111)
  G. Vanacore, L.F. Zagonel and N. Barrett, Surf. Sci. 604 1674 (2010).
• Full field chemical imaging of buried native sub-oxide layers on doped silicon patterns
  F. de la Peña, N. Barrett, L.F. Zagonel, M. Walls, O. Renault, Surf. Sci. 604 1628 (2010).
• Direct observation of carrier density at Fermi level in Al doped ZnO films
  P. Torelli, M. Gabás, M. Sacchi, N.T. Barrett, L. Simonelli, P. Díaz-Carrasco, J.R. Ramos-Barrado submitted to Appl. Phys. Lett. (2010)
• Impact of the TiN electrode deposition on the HfO₂ band gap for advanced MOSFETS gate stacks
  C. Gaumer, E. Martinez, S. Lhostis, M.-J. Guittet, M. Gros-Jean_, J.-P. Barnes, C. Licitra, N. Rochat, N. Barrett, F. Bertin, A. Chabli, Microelectronic Engineering 88, 72 (2011).
• XPEEM, une technique d’analyse de surface parfaitement adaptée aux matériaux innovants
  N. Barrett, O. Renault Clefs CEA 59, 112 (2010).
• X-ray Photoelectron Spectroscopy and Ultraviolet Photoelectron Spectroscopy investigation of Al-related dipole at the HfO₂/Si interface
  L.Q.Zhu , N.Barrett, P. Jégou, F. Martin, C. Leroux, E. Martinez, H. Grampeix, O. Renault, A. Chabli J. Appl. Phys 105 024102 (2009)
• X-ray Photoelectron Spectroscopy and Ultraviolet Photoelectron Spectroscopy investigation of Al-related dipole at the HfO₂/Si interface
  L.Q.Zhu , N.Barrett, P. Jégou, F. Martin, C. Leroux, E. Martinez, H. Grampeix, O. Renault, A. Chabli February 2, 2009 issue of Virtual Journal of Nanoscale Science & Technology.
• X-ray Photoelectron Spectromicroscopy of Doped Silicon Patterns
  N. Barrett, M. Lavayssière, L. F. Zagonel, A. Bailly, O. Renault AIP Conference Proceedings 1173 1 (2009)
• Spatially-resolved, energy-filtered imaging of core level and valence band photoemission of highly p and n doped silicon patterns
  N Barrett, L F Zagonel, O Renault, A Bailly J. Phys. Condens. Matter 21 314015 (2009)
• Orientation dependent work function of in situ annealed strontium titanate
  L F Zagonel, M Bäurer, A Bailly, O Renault, M Hoffmann, S-J Shih, D Cockayne , N Barrett J. Phys. Condens. Matter 21 314013 (2009)
• Aspects of lateral resolution using energy-filtered core-level photoelectron emission microscopy
  A Bailly O Renault, N Barrett, T Desrues, D Mariolle, L F Zagonel, and M Escher J. Phys. Condens. Matter 21 314002 (2009)
• Chemical and electronic interface structure of spray pyrolysis deposited undoped and Aldoped ZnO thin films on a commercial Cz-Si solar cell substrate
  M. Gabas, N.Barrett, J. R. Ramos-Barrado, S. Gota, C. Rojas, M-C Lopez-Escalante Solar Energy Materials and Solar Cells 93 1356 (2009)
• La spectromicroscopie XPEEM avec le rayonnement synchrotron
  N. Barrett, O. Renault Matériaux et Techniques 97 101-122 (2009)
• Multiple scattering X-ray photoelectron diffraction study of the SrTiO₃(100) surface
  A. Pancotti, N. Barrett L.F. Zagonel, G. M. Vanacore, J. Appl. Phys. 106 034104 (2009)
• Core level photoelectron spectromicroscopy with Al Ka excitation at 500 nm spatial resolution
  O. Renault, M. Lavayssière, A. Bailly, D. Mariolle, N. Barrett J. Electr. Spectrosc. Relat. Phenom. 171, 71 (2009)
• High resolution photoelectron spectroscopy of Ge/HfO2 gate stacks
  O. Renault, E. Martinez, N. Barrett, Elettra Highlights 2006-7, p 44.
• High resolution photoelectron spectroscopy of Ge-based HfO₂ gate stacks
  O. Renault, L. Fourdrinier, E. Martinez, L. Clavelier, and C. Leroyer, N. Barrett, C. Crotti, Appl. Phys. Lett. 90, (2007) 052112.
• Photoelectron study of the effect of substrate doping on an HfO₂/SiO₂/n-Si gate stack
  N. Barrett, O. Renault, J.-F. Damlencourt, F. Maccherozzi, M. Fabrizioli, J. Non-Cryst. Solids 353 ( 2007) 635-638.
• Band mapping in the one-step photoemission theory: Multi-Bloch-wave structure of final states and interference effects
  E. E. Krasovskii, V. N. Strocov, N. Barrett, H. Berger, W. Schattke, and R. Claessen, Phys. Rev. B, 75 (2007) 045432.
• Core level photoemission study of nitrided hafnium silicate thin films
  N. Barrett, O. Renault, P. Besson, Y. Le Tiec, F. Martin and F. Calvat, Microelectronic Engineering84 (2007) 2302-2305.
• Energy-filtered XPEEM with NanoESCA using synchrotron and laboratory x-ray sources: principles and first demonstrated results
  O. Renault, N. Barrett, A. Bailly, L. Zagonel, J. C. Cezar, N. B. Brookes, K. Winkler, B. Krömker, and D. Funnemann, Surf. Sci. 601 (2007) 4727-4732.
• Band offsets of HfO₂/GeON/Ge stacks measured by ultraviolet and soft x-ray photoelectron spectroscopies
  E. Martinez, O. Renault, L. Fourdrinier, L. Clavelier, C. Le Royer, C. Licitra, T. Veyron, J. M. Hartmann, V. Loup, L. Vandroux, Appl. Phys. Lett. 90 (2007) 053508.
• Investigation on the nature of the chemical link between acetylenic organosilane self-assembled monolayers and Au(1 1 1) by means of synchrotron radiation photoelectron spectroscopy and scanning tunneling microscopy
  N. Katsonis, A. Marchenko, D. Fichou and N. Barrett, Surf. Sci. 602 9 (2008).
• Orientation dependent surface composition of in situ annealed strontium titanate
  L.-F. Zagonel, N. Barrett, O. Renault, A. Bailly, M. Bäurer, M. Hoffmann, S.-J. Shih, D. Cockayne soumis à Surf. Inter. Anal. (2007).
• Changes in macroscopic behaviour through segregation in Niobium doped Strontium Titanate
  M. Bäurer, L.-F. Zagonel, N. Barrett, M. Hoffmann J. Phys. Conf. Series à paraître (2008).
• Premiers résultats en microscopie à émission des photoélectrons avec des rayons X (XPEEM)
  N. Barrett, L.-F. Zagonel, Fait marquant IRAMIS-DRECAM
• Cartographie du travail de sortie de céramiques SrTiO3
  N. Barrett, L.-F. Zagonel, Brèves du DRECAM n°161 (revue interne)
• Local silicon doping as a promoter of patterned electrografting of diazonium for directed surface functionalization
  J. Charlier, S. Palacin, J. Leroy, D. Del Frari, L. Zagonel, N. Barrett, O. Renault, A. Bailly, soumis à J. Chem Mater. soumis (2008).
• Investigating Electronic and Chemical Properties Of HfO₂/GeO_xN_y/Ge Gate Stacks : High-Resolution Photoelectron Spectroscopy Using Synchrotron Radiation
  O. Renault, E. Martinez, L. Fourdrinier, L. Clavelier, C. Le Royer, N. Barrett and C. Crotti, ECS Transactions, vol. 3 n°2 (2006)
• Three dimensional band structure of layered TiTe₂: Photoemission final-state effects
  V.N. Strocov, E.E Krasovskii, W. Schattke, N. Barrett, H. Berger, D. Schrupp, R. Claessen, Phys. Rev. B 74 195125 (2006)
• World Record Resolution in Imaging XPS
  O. Renault, N. Barrett, K. Winkler, A. Bailly, B. Krömker, L. Zagonel, D. Funnemann, J.C. Cezar, N. Brookes PICO – Omicron News December (2006)
• Exchange and correlation effects in electronic excitations of Cu₂O
  F. Bruneval, N. Vast, L. Reining, M. Izquierdo, F. Sirotti, N. Barrett, Phys. Rev. Lett.97 267601 (2006)
• Calcification rate influence on trace element concentrations in aragonitic bivalve shells: Evidences and mechanisms
  M. Carré, I. Bentaleb, O. Bruguier, E. Ordinola, N. Barrett, M. Fontugne, Geochimica et Cosmochimica Acta70 4906 (2006)
• A comparative XPS and UPS study of VO_x layers on mineral TiO₂(001)-anatase supports
  G. Silversmit, H. Poelman, D. Depla, N. Barrett, G.B. Marin, R. De Gryse, Surf. Interface Anal. 38 1257 (2006)
• Band offsets of nitrided ultra-thin Hf-silicate films
  N. T. Barrett, O. Renault, Y. Le Tiec, P. Besson, F. Martin, Appl. Phys. Lett. 88 162906 (2006)
• Modelling the XPS Si 2p core-level intensities of silicon nanocrystals for determination of oxide shell thickness
  O. Renault, R. Marlier, N.T. Barrett, E. Martinez, T. Baron, M. Gely, B. de Salvo Surf. Inter. Analy.38 486 (2006)
• Reponse to “Comment on ‘Unraveling the conduction mechanism of Al-doped ZnO films by valence band soft X-Ray photoemission spectroscopy”
  M. Gabás, S. Gota, J. R. Ramos-Barrado, M. Sánchez, N. T. Barrett, J. Avila, M. Sacchi, Appl. Phys. Lett. 86 216102 (2005)
• Unraveling the conduction mechanism of Al-doped ZnO films by valence band soft X-Ray photoemission spectroscopy
  M. Gabás, S. Gota, J. R. Ramos-Barrado, M. Sánchez, N. T. Barrett, J. Avila, M. Sacchi, Appl. Phys. Lett. 86 042104 (2005)
• Rhinocrotid tooth enamel ¹⁸O/¹⁶O variability between 23 and 12 Ma in southwestern France
  I. Bentaleb, C. Langlois, C. Martin, P. Iacumin, M. Carré, P.-O. Antoine, F. Duranthon, I. Moussa, J.-J. Jaeger, N. Barrett, R. Kandoorp 338 172 Géosciences (2005)
• Synchrotron radiation x-ray photoelectron spectroscopy of Si nano-crystals grown onto Al₂O₃/Si surfaces
  O. Renault, R. Marlier, M. Gely, B. De Salvo, T. Baron, M. Hansson, N.T. Barrett Appl. Phys. Lett. 87 163119 (2005)
• A fully oxidized V₂O₅/TiO₂(001)-anatase system studied with in-situ synchrotron photoelectron spectroscopy
  G. Silversmit, H. Poelman, D. Depla, D. Poelman, N. Barrett, G.B. Marin, R. De Gryse Surf. Sci.584 179 (2005).
• Elastic scattering effects in the electron mean free path in a graphite overlayer studied by photoelectron spectroscopy and LEED
  N. Barrett, J.-M. Themlin, E.E. Krasovskii, V.N. Strocov Phys. Rev. B, 71 035427 (2005)
• Thermal stability of the HfO₂/SiO₂ interface for sub-0.1 mm CMOS gate oxide stacks : A valence band and quantitative core-level study by soft x-ray photoelectron spectroscopy
  N. Barrett, O. Renault, J.-F. Damlencourt, F. Martin J. Appl. Phys.96 6362 (2004)
• Elastic scattering effects in the electron mean free path in a graphite overlayer studied by PES and LEED
  N. Barrett, E.E. Krasovskii, J.-M. Themlin, V.N. Strocov Surf. Sci.566 532 (2004)
• Photoemission study of EuS/PbS electronic structure
  B.A Orlowski, E. Guziewicz, B.J. Kowalski, T. Story, S. Mickevicius, A.Y. Sipatov, M. Chernyshova,; I.N. Demchenko, N. Barrett, M. Taniguchi, A. Kimura, H. Sato,; C.A. Sebenne, J.P. Lacharme, R. Medicherla, W. Drube,J. Alloys Comp. 362 198 (2004)
• Electronics of the SiO₂/HfO₂ interface by soft x-ray photoemission spectroscopy
  O. Renault, N. T. Barrett, D. Samour and S. Quiais-Marthon Surf. Sci 566 526 (2004)
• Advanced characterization of high-K materials interfaces by high-resolution photoemission using synchrotron radiation
  O. Renault, N. Barrett, D. Samour, J.-F. Damlencourt, D. Blin, S. Quiais-Marthon CP683 Characterization and Metrology for ULSI Technology: 2003 International Conference
• CO adsorption on Pt_xPd_1-x(111) single crystal alloy surfaces : a core level and valence band photoemission study
  D. Radosavkic, N. Barrett, R. Belkhou, N. Marsot, C. Guillot Surf. Sci.516 56-68 (2002)
• HfO₂/SiO₂ interface chemistry studied by synchrotron radiation x-ray photoelectron spectroscopy
  O. Renault, D. Samour, J.-F. Damiencourt, D. Blin, F. Martin, S. Marthon, N.T. Barrett, P. Besson, Appl. Phys. Lett. 81 3627 (2002)
• Photoemission from graphite : Intrinsic and Self-energy effects
  V.N. Strocov, A. Charrier, J.-M. Themlin, M. Rohlfing, R. Claessen, N. Barrett, J. Avila, J. Sanchez, M.-C. Asensio Phys. Rev. B64 075105 (2001
• Electronic properties of -Sn(100)2×1 : Evidence for asymmetric dimer reconstruction
  A. Cricenti, P. Perfetti, N. Barrett, C. Guillot, Y.Vu. Aristov, G. Le Lay, Appl. Phys. Lett. 78 3032 (2001)
• Photoelectron diffraction study on Ge(100) 3d core level
  L. Ferrari, M. Pedio, N. Barrett, R. Gunnella, M. Capozi, C.Ottaviani, P. Perfetti Surf. Sci. 482-485 1287 (2001)
• Photoemission studies of -Sn(100)2×1 surface
  G. Le Lay, V.Yu. Aristov, A. Cricenti, P. Perfetti, N. Barret C.Guillot Surf. Sci. 482-485 552 (2001)
• Ge/Ag(111) semiconductor on metal growth : Formation of an Ag₂Ge surface alloy
  H. Oughaddou, S. Sawaya, J. Goniakowski, B. Aufray, G. Le Lay, J.M. Gay, G. Tréglia, J.P. Bibérian, JN. Barrett, C. Guillot, A. Mayne, G. Dujardin Phys. Rev. B62 16653 (2000)
• Semiconductor on metal adsorption: Ge Tetramers on the Ag(001) surface
  H. Oughaddou, B. Aufray, G. Le Lay, J.M. Gay, J.H. Zeysing, R.L. Johnson, N. Barrett, C. Guillot Appl. Surf. Sci.162-3 74 (2000)
• Electronic structure of the La-Pt(111) surface alloy
  A Ramstad, S. Raaen, N. Barrett Surf. Sci. 448 179 (2000)
• Structure and growth mode of epitaxial Co/Au(111) magnetic thins films
  R. Belkhou, N. Marsot, N. Magnan, P. Le Fèvre, N. Barrett, C. Guillot, D. Chandesris J. Electr. Spectros. Relat. Phenom.101-103 787 (1999).
• VUV-Photoelectron spectroscopy of scintillation materials
  A.N.Belsky, C.Dujardin, I.Kamenskikh, A.Philippov, C.Guillot, N.Barrett, G.Dujardin, L.Hellner, G.Comtet and C.Pedrin Proc. of the Fifth Int. Conf. on Inorganic Scintillators and their Applications, August 16-20,1999, Moscow State University, Russia
• From CdTe/Fe Schottky barrier to Cd_1-xFe_xTe semimagnetic semiconductor
  B.A. Orlowski, E. Guziewicz, B.J. Kowalski, N. Barrett, R. Belkhou, D. Radosavkic, D. Martinotti, C. Guillot, J.-P. Lacharme, C.A. Sebenne Appl. Surf. Sci.123/124 631 (1998).
• From metal-semiconductor junction to ternary alloy crystal
  B.A. Orlowski, E. Guziewicz, B.J. Kowalski, N. Barrett, R. Belkhou, D. Radosavkic, D. Martinotti, C. Guillot, J.-P. Lacharme, C.A. Sebenne Electron-Technology. 31 323 (1998).
• From CdTe/Fe Schottky barrier to Cd_1-xFe_xTe semimagnetic semiconductor
  B.A. Orlowski, E. Guziewicz, B.J. Kowalski, N. Barrett, R. Belkhou, D. Radosavkic, D. Martinotti, C. Guillot, J.-P. Lacharme, C.A. Sebenne Appl. Surf. Sci. 123/124 631 (1998).
• Core level photoemission study of nitrided hafnium silicate thin films
  N. Barrett, O. Renault, P. Besson, Y. Le Tiec, F. Martin and F. Calvat, Microelectronic Engineering84 (2007) 2302-2305.