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Fonction
- Directeur de recherche
- Chef du groupe Laboratoire d’études des nanostructures et d’imagerie de surface (LENSIS)
Sujets de recherche
La structure de bandes d’oxydes en particulier développement d’une méthode pour aller au-delà de l’approximation de l’électron libre pour l’état final
- le travail de sortie
- l’état chimique
- la densité d’états
- la structure de bandes avec une résolution latérale ~100 nm.
Publications scientifiques
Publications récentes dans la base HAL-CEA.
Thickness-Dependent Polarization of Strained BiFeO3 Films with Constant Tetragonality,
J. E. Rault, W. Ren, S. Prosandeev, S. Lisenkov, D. Sando, S. Fusil, M. Bibes, A. Barthélémy, L. Bellaiche, and N. Barrett, Physical Review Letters 109, 267601 (2012)
Polarization dependent chemistry of ferroelectric BaTiO3(001) domains,
Y. Mi, G. Geneste, J. E. Rault, C. Mathieu, A. Pancotti and N. Barrett, Journal of physics. Condensed matter: an Institute of Physics journal 24, 275901 (2012)
Expanding the view into complex material systems: From micro-ARPES to nanoscale HAXPES,
C. M. Schneider, C. Wiemann, M. Patt, V. Feyer, L. Plucinski, I. P. Krug, M. Escher, N. Weber, M. Merkel, O. Renault, N. Barrett, Journal of Electron Spectroscopy and Related Phenomena 185, 330-339 (2012)
Dark field photoelectron emission microscopy of micron scale few layer graphene,
N. Barrett, E.H. Conrad, K. Winkler, B. Krömker, The Review of Scientific Instruments 83, 083706 (2012)
Chemistry and Atomic Distortion at the Surface of an Epitaxial BaTiO3 Thin Film after Dissociative Adsorption of Water,
J. L. Wang, F. Gaillard, A. Pancotti, B. Gautier, G. Niu, B. Vilquin, V. Pillard, G. L. M. P. Rodrigues, and N. Barrett, Journal of Physical Chemistry C 116, 21802-21809 (2012)
Screening of ferroelectric domains on BaTiO3(001) surface by ultraviolet photo-induced charge and dissociative water adsorption,
J. L. Wang, B. Vilquin and N. Barrett Applied Physics Letters 101, 092902 (2012)
Electrical and physical topography in energy-filtered photoelectron emission microscopy of two-dimensional silicon pn junctions,
M. Lavayssière, N. Barrett, M. Escher, O. Renault, Journal of Electron Spectroscopy and Related Phenomena Accepted (2013)
Full Field electron spectromicroscopy applied to ferroelectric materials,
N. Barrett et al, Journal of Applied Physics, accepted (2013)
Interface Electronic Structure in a Metal/Ferroelectric Heterostructure under Applied Bias,
J. E. Rault, G. Agnus, T. Maroutian, V. Pillard, Ph. Lecoeur, G. Niu, B. Vilquin, M. G. Silly, A. Bendounan, F. Sirotti, and N. Barrett, Physical Review B submitted (2013)
Laboratory-based real and reciprocal space imaging of the electronic structure of few layer graphene on SiC(000-1) using photoelectron emission microscopy, N. Barrett, K. Winkler, B. Krömker, E.H. Conrad, Ultramicroscopy, submitted (2013)
X-ray photoelectron diffraction study of relaxation and rumpling of ferroelectric domains in BaTiO3(001),
A. Pancotti, J. L. Wang, P. Chen, L. Tortech, C.-M. Teodorescu, E. Frantzeskakis, N. Barrett, Physical Review B, submitted (2013)
Dissociative adsorption of H2O on epitaxially strained, out-of-plane polarized, BaTiO3(001) thin films,
J. Wang, N. Barrett, F. Gaillard, G. Niu and B. Vilquin, Physical Chemistry Chemical Physics, submitted (2013)
Thickness-Dependent Polarization of Strained BiFeO3 Films with Constant Tetragonality,
J. E. Rault, W. Ren, S. Prosandeev, S. Lisenkov, D. Sando, S. Fusil, M. Bibes, A. Barthélémy, L. Bellaiche, and N. Barrett, Physical Review Letters 109, 267601 (2012)
Polarization dependent chemistry of ferroelectric BaTiO3(001) domains,
Y. Mi, G. Geneste, J. E. Rault, C. Mathieu, A. Pancotti and N. Barrett, Journal of physics. Condensed matter: an Institute of Physics journal 24, 275901 (2012)
Expanding the view into complex material systems: From micro-ARPES to nanoscale HAXPES,
C. M. Schneider, C. Wiemann, M. Patt, V. Feyer, L. Plucinski, I. P. Krug, M. Escher, N. Weber, M. Merkel, O. Renault, N. Barrett, Journal of Electron Spectroscopy and Related Phenomena 185, 330-339 (2012)
Dark field photoelectron emission microscopy of micron scale few layer graphene,
N. Barrett, E.H. Conrad, K. Winkler, B. Krömker, The Review of Scientific Instruments 83, 083706 (2012)
Chemistry and Atomic Distortion at the Surface of an Epitaxial BaTiO3 Thin Film after Dissociative Adsorption of Water,
J. L. Wang, F. Gaillard, A. Pancotti, B. Gautier, G. Niu, B. Vilquin, V. Pillard, G. L. M. P. Rodrigues, and N. Barrett, Journal of Physical Chemistry C 116, 21802-21809 (2012)
Screening of ferroelectric domains on BaTiO3(001) surface by ultraviolet photo-induced charge and dissociative water adsorption,
J. L. Wang, B. Vilquin and N. Barrett Applied Physics Letters 101, 092902 (2012)
Electrical and physical topography in energy-filtered photoelectron emission microscopy of two-dimensional silicon pn junctions,
M. Lavayssière, N. Barrett, M. Escher, O. Renault, Journal of Electron Spectroscopy and Related Phenomena Accepted (2013)
Full Field electron spectromicroscopy applied to ferroelectric materials,
N. Barrett et al, Journal of Applied Physics, accepted (2013)
Interface Electronic Structure in a Metal/Ferroelectric Heterostructure under Applied Bias,
J. E. Rault, G. Agnus, T. Maroutian, V. Pillard, Ph. Lecoeur, G. Niu, B. Vilquin, M. G. Silly, A. Bendounan, F. Sirotti, and N. Barrett, Physical Review B submitted (2013)
Laboratory-based real and reciprocal space imaging of the electronic structure of few layer graphene on SiC(000-1) using photoelectron emission microscopy,
N. Barrett, K. Winkler, B. Krömker, E.H. Conrad, Ultramicroscopy, submitted (2013)
X-ray photoelectron diffraction study of relaxation and rumpling of ferroelectric domains in BaTiO3(001),
A. Pancotti, J. L. Wang, P. Chen, L. Tortech, C.-M. Teodorescu, E. Frantzeskakis, N. Barrett, Physical Review B, submitted (2013)
Dissociative adsorption of H2O on epitaxially strained, out-of-plane polarized, BaTiO3(001) thin films,
J. Wang, N. Barrett, F. Gaillard, G. Niu and B. Vilquin, Physical Chemistry Chemical Physics, submitted (2013)
Direct observation of Al-doping-induced electronic states in the valence band and band gap of ZnO films
M. Gabas, P. Torelli, N. Barrett, M. Sacchi, F. Bruneval, Y. Cui, L. Simonelli, P. Diaz-Carrasco, J.R. Ramos Barrado, Phys. Rev. B 84, 153303 (2011)
Skin Layer of BiFeO3 Single Crystals
X. Martí, P. Ferrer, J. Herrero-Albillos, J. Narvaez, V. Holy, N. Barrett, M. Alexe, and G. Catalan, Phys. Rev. Lett. 106, 236101 (2011)
Ferroelectricity in a quasiamorphous ultrathin BaTiO3 film
J. L. Wang, A. Pancotti, P. Jégou, G. Niu, B. Gautier, Y.Y. Mi, L. Tortech, S. Yin, B. Vilquin, N. Barrett, Phys. Rev. B 85, 205426 (2011)
Microscopic correlation between chemical and electronic states in epitaxial graphene on SiC(000-1)
C. Mathieu, J. Rault, Y. Mi, B. Zhang, W. A. de Heer, C. Berger, E. Conrad, O. Renault, N. Barrett. Phys. Rev. B 83, 235436 (2011)
Photoemission induced bias in two-dimensional silicon pn junctions
M. Lavayssière,O. Renault, D. Mariolle, M. Veillerot, J. P. Barnes, J. M. Hartmann, J. Leroy, and N. Barrett Appl. Phys. Lett. 99, 202107 (2011)
Recent advances in 2D-band structure imaging by k-PEEM and prospects for technological materials
C. Mathieu, O. Renault, H. Rotella, N. Barrett., A. Chabli. Proc. of FCMN (AIP), 2011.
Extrinisic screening of ferroelectric domains in Pb(Zr0.48Ti0.52)O3
I. Krug, N. Barrett, A. Petraru, A. Locatelli, T.O. Mentes, M.A. Niño, K. Rahmanizadeh, G. Bihlmayer, C.M. Schneider, Appl. Phys. Lett. 97, 222903 (2010)
Applications of high lateral and energy resolution imaging XPS with a double hemispherical analyser based spectromicroscope
M. Escher, K. Winkler, O. Renault, N. Barrett, J. Electr. Spectr. Relat. Phenom. 178-179 303 (2010)
Influence of the ferroelectric polarization on the electronic structure of BaTiO3 thin films
N. Barrett, J. Rault, I. Krug, B. Vilquin, G. Niu, B. Gautier, D. Albertini, P. Lecoeur, O. Renault Surf. Inter. Anal. (2010). DOI: 10.1002/sia.3369
Nanoscale surface chemistry of individual Si nanowires by energy-filtered XPEEM
O. Renault, A. Bailly, L. –F. Zagonel and N. Barrett
Surface enhanced covalency and Madelung potentials in Nb doped SrTiO3 (100), (110) and (111)
G. Vanacore, L.F. Zagonel and N. Barrett, Surf. Sci. 604 1674 (2010).
Full field chemical imaging of buried native sub-oxide layers on doped silicon patterns
F. de la Peña, N. Barrett, L.F. Zagonel, M. Walls, O. Renault, Surf. Sci. 604 1628 (2010).
Direct observation of carrier density at Fermi level in Al doped ZnO films
P. Torelli, M. Gabás, M. Sacchi, N.T. Barrett, L. Simonelli, P. Díaz-Carrasco, J.R. Ramos-Barrado submitted to Appl. Phys. Lett. (2010)
Impact of the TiN electrode deposition on the HfO2 band gap for advanced MOSFETS gate stacks
C. Gaumer, E. Martinez, S. Lhostis, M.-J. Guittet, M. Gros-Jean, J.-P. Barnes, C. Licitra, N. Rochat, N. Barrett, F. Bertin, A. Chabli, Microelectronic Engineering 88, 72 (2011).
XPEEM, une technique d’analyse de surface parfaitement adaptée aux matériaux innovants
N. Barrett, O. Renault Clefs CEA 59, 112 (2010).
X-ray Photoelectron Spectroscopy and Ultraviolet Photoelectron Spectroscopy investigation of Al-related dipole at the HfO2/Si interface
L.Q.Zhu , N.Barrett, P. Jégou, F. Martin, C. Leroux, E. Martinez, H. Grampeix, O. Renault, A. Chabli J. Appl. Phys 105 024102 (2009)
X-ray Photoelectron Spectroscopy and Ultraviolet Photoelectron Spectroscopy investigation of Al-related dipole at the HfO2/Si interface
L.Q.Zhu , N.Barrett, P. Jégou, F. Martin, C. Leroux, E. Martinez, H. Grampeix, O. Renault, A. Chabli February 2, 2009 issue of Virtual Journal of Nanoscale Science & Technology.
X-ray Photoelectron Spectromicroscopy of Doped Silicon Patterns
N. Barrett, M. Lavayssière, L. F. Zagonel, A. Bailly, O. Renault AIP Conference Proceedings 1173 1 (2009)
Spatially-resolved, energy-filtered imaging of core level and valence band photoemission of highly p and n doped silicon patterns
N Barrett, L F Zagonel, O Renault, A Bailly J. Phys. Condens. Matter 21 314015 (2009)
Orientation dependent work function of in situ annealed strontium titanate
L F Zagonel, M Bäurer, A Bailly, O Renault, M Hoffmann, S-J Shih, D Cockayne , N Barrett J. Phys. Condens. Matter 21 314013 (2009)
Aspects of lateral resolution using energy-filtered core-level photoelectron emission microscopy
A Bailly O Renault, N Barrett, T Desrues, D Mariolle, L F Zagonel, and M Escher J. Phys. Condens. Matter 21 314002 (2009)
Chemical and electronic interface structure of spray pyrolysis deposited undoped and Aldoped ZnO thin films on a commercial Cz-Si solar cell substrate
M. Gabas, N.Barrett, J. R. Ramos-Barrado, S. Gota, C. Rojas, M-C Lopez-Escalante Solar Energy Materials and Solar Cells 93 1356 (2009)
La spectromicroscopie XPEEM avec le rayonnement synchrotron
N. Barrett, O. Renault Matériaux et Techniques 97 101-122 (2009)
Multiple scattering X-ray photoelectron diffraction study of the SrTiO3(100) surface
A. Pancotti, N. Barrett L.F. Zagonel, G. M. Vanacore, J. Appl. Phys. 106 034104 (2009)
Core level photoelectron spectromicroscopy with Al Ka excitation at 500 nm spatial resolution
O. Renault, M. Lavayssière, A. Bailly, D. Mariolle, N. Barrett J. Electr. Spectrosc. Relat. Phenom. 171, 71 (2009)
High resolution photoelectron spectroscopy of Ge/HfO2 gate stacks
O. Renault, E. Martinez, N. Barrett, Elettra Highlights 2006-7, p 44.
High resolution photoelectron spectroscopy of Ge-based HfO2 gate stacks
O. Renault, L. Fourdrinier, E. Martinez, L. Clavelier, and C. Leroyer, N. Barrett, C. Crotti, Appl. Phys. Lett. 90, (2007) 052112.
Photoelectron study of the effect of substrate doping on an HfO2/SiO2/n-Si gate stack
N. Barrett, O. Renault, J.-F. Damlencourt, F. Maccherozzi, M. Fabrizioli, J. Non-Cryst. Solids 353 ( 2007) 635-638.
Band mapping in the one-step photoemission theory: Multi-Bloch-wave structure of final states and interference effects
E. E. Krasovskii, V. N. Strocov, N. Barrett, H. Berger, W. Schattke, and R. Claessen, Phys. Rev. B, 75 (2007) 045432.
E. Martinez, O. Renault, L. Fourdrinier, L. Clavelier, C. Le Royer, C. Licitra, T. Veyron, J. M. Hartmann, V. Loup, L. Vandroux, Appl. Phys. Lett. 90 (2007) 053508.
M. Gabás, S. Gota, J. R. Ramos-Barrado, M. Sánchez, N. T. Barrett, J. Avila, M. Sacchi, Appl. Phys. Lett. 86 042104 (2005)
O. Renault, R. Marlier, M. Gely, B. De Salvo, T. Baron, M. Hansson, N.T. Barrett Appl. Phys. Lett. 87 163119 (2005)