Near field microscopies cover a whole of techniques making it possible to visualize the surface of materials at a nanometric scale.
These microscopies gather:
– Scanning Tunneling Microscopy (STM)
– Atomic Force Microscopy (AFM)
– Magnetic Force Microscopy (MFM)
All these techniques have in common the positioning nanometric of a tip on top of the sample whose position is controlled according to the selected signal (current, force).
