Scanning electron microscopy :
Scanning electron microscopy (SEM) is an electron microscopy technique for observing the surface of a sample.
LEDNA (Laboratoires Edifices Nanométriques) has a Zeiss Ultra 55 SEM-FEG equipped with a Field Emission Gun (FEG), coupled with Bruker EDX (Energy Dispersive X-ray Spectrometry) chemical analysis.
- Resolution: 1 nm @15kV; 1.7 nm @1kV; 4 nm @0.1kV
- Voltages: 0.1 to 30 kV
- Magnification: 12 to 900,000 x
- 5-axis motorized sample stage
- Introduction lock for solid sample
- Resolution: visualization of nanoparticles, carbon nanotubes (mat / individual)
- Possibility of angled images (on the sample edge).
Transmission electron microscopy:
LEDNA has privileged access to the transmission electron microscopy platforms of the TEMPOS EQUIPEX and the CIMEX platform at the Ecole Polytechnique.
- EQUIPEX TEMPOS (Transmission Electron Microscopy at Palaiseau Orsay Saclay)
- CIMEX platform – Centre Interdisciplinaire de Microscopie Electronique de l’Ecole polytechnique.
