Recherche
fr
en
LENSIS
Presentation
Home
Presentation
Research topics
Techniques and instruments
Key figures
News & Events
Research
Research projects
Publications
Thesis
Team
Members
Directory
Join us
Open positions
Fixed-term contracts
Post-doctorates
Thesis
Internships
Contact us
Access map
Contact us
Techniques and Instruments
Diffraction
Microscopies électroniques TEM, MEB et LEEM/PEEM
X-ray photoelectrons spectroscopy (XPS)
X-ray Photoelectron Diffraction(XPD)
Development of novel XPEEM (spatial,momentum and energy resolved)
149360
