The X-ray diffractometry is one of the most established techniques for identifying and characterizing polycrystalline materials, in order to determine their crystallography, polymorphic structure and phases, and to observe changes in crystallinity.
The LEDNA is equipped with a BRUKER DRX, model D2 Phaser:
- Integrated X-ray generator: 30kV / 10mA
- Radiation level < 1µsV/h
- Angular range: -3° to 145
- Cu source with Ni filter to suppress Cu Kβ
- SSD detector with 160 channels
