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Local control and imaging of ferroelectric domains in HfZrO2 layers using piezoelectric force (PFM) and electron microscopy (LEEM-PEEM) techniques
Stage M2CEA Saclay, (91) Essonne, FranceFebruary 3 20255 monthDomain, Specialties : Material physics Keywords: Surfaces, interfaces, imaging, microscopy, PFM, LEEM, PEEM Research Unit : SPEC/LENSIS This internship focuses on the characterization of ferroelectric (FE) domains in hafnium zirconium oxide (HZO) films. We propose to train the student to use several surface imaging techniques (piezoelectric force microscopy, PFM, low energy electron microscopy, LEEM, and…
PhD thesis
Actuellement aucune thèse disponible pour : LENSIS