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Publications LENSIS

Les notices de toutes les publications, manuscrits de thèse, communications orales, posters… issus du SPEC/LENSIS peuvent être consultés sur la plateforme HAL “Open science” :

Voir les publications SPEC/LENSIS

Nos publications antérieures à 2017… :

2017

  • Electrical respons of Pt/Ru/PbZr0.52Ti0.48O3/Pt capacitor as function of lead precursor excess, I. Gueye, G. Le Rhun, O. Renault, E. Defay, N. Barrett. Applied Physics Letters, 111, 222902 (2017).
  • Control of surface potential at polar domain walls in a non-polar oxide, G. F. Nataf, M. Guennou, J. Kreisel, P. Hicher, R. Haumont, O. Aktas, E. K. H. Salje, L. Tortech, C. Mathieu, D. Martinotti, N. Barrett. Accepted in Physical Review Materials, XX, XXX (2017).
  • Raman signatures of ferroic domain walls captured by principal component analysis, G. F. Nataf, N. Barrett, J. Kreizel, M. Guennou. Accepted in Journal of Physics: Condensed Matters, XXX, XXX (2017).
  • Room temperature 2D electron gas at the (001)-SrTiO3 surface, S. Gonzalez, C. Mathieu, O. Copie, V. Feyer, C. M. Schneider, N. Barrett. Applied Physic Letters, 111, 181601 (2017).
  • Adsorbate Screening of Surface Charge of Microscopic Ferroelectric Domains in Sol−Gel PbZr0.2Ti0.8O3 Thin Films, O. Copie, N. Chevalier, G. Le Rhun, C. L. Rountree, D. Martinotti, S. Gonzalez, C. Mathieu, O. Renault, N. Barrett. ACS Applied Materials & Interfaces, 9, 29311 (2017).
  • Forming mechanism of Te-based conductive-bridge memories, M. Kazar Mendez, E. Martinez, A. Marty, M. Veillerot, Y. Yamashita, R. Gassilloud, M. Bernard, O. Renault, N. Barrett. Accepted in Applied Surface Science, XX, XXX (2017).
  • Operando hard X-ray photoelectron spectroscopy study of the Pt/Ru/PbZr0.52Ti0.48O3 interface, I. Gueye, G. Le Rhun, O. Renault, D. Cooper, D. Ceolin, J. P. Rueff, N. Barrett. Applied Physics Letters, 111, 032906 (2017).
  • Laboratory based X-ray photoemission core-level spectromicroscopy of resistive oxide memories, D. M. Gottlob, E. Martinez, C. Mathieu, C. Lubin, N. Chevalier, M. Kazar Mendes, C. Charpin, E. Jalaguier, O. Renault, N. Barrett. Ultramicroscopy, 183, 94 (2017).

2016

  • Chemistry of surface nanostructures in lead precursor-rich PbZr0.52Ti0.48O3 sol-gel films, I. Gueye, G. Le Rhun, P. Gergaud, O. Renault, E. Defay, N. Barrett. Applied Surface Science, 363, 21 (2016).
  • Evolution of defect signatures at ferroelectric domain walls in Mg-doped LiNbO3, G. F. Nataf, M. Guennou, A. Haussmann, N. Barrett, J. Kreisel. Phys. status solidi – Rapid Res. Lett., 10, 222 – 226 (2016).
  • Laterally inhomogeneous Au intercalation in epitaxial graphene on SiC(0001): a multimethod electron microscopy study, C. Mathieu, T. O. Mentes, E. Pallecchi, A. Locatelli; G. Patriarche, R. Belkhou, A. Ouerghi. Intech. Edited by Pramoda Kumar Nayak, Chapter 6, p.135 Published october 12, 2016.
    ISBN: 978-953-51-2639-3.
  • Low energy electron imaging of domains and domain walls in magnesium-doped lithium niobate, G. F. Nataf, P. Grysan, M. Guennou, J. Kreisel, D. Martinotti, C. L. Rountree, C. Mathieu, N. Barrett. Scientific Reports, 6, 33098 (2016)
  • Interface-mediated ferroelectric patterning and Mn valency in nano-structured PbTiO3/La0.7Sr0.3MnO3, I. P. Krug, H. Doganay, F. Nickel, D. M. Gottlob, C. M. Schneider, A. Morelli, D. Preziosi, I. Lindfors-Vrejoiu, R. Laskowski and N. Barrett. Journal of Applied Physics, 120, 095304 (2016)
  • Bi atoms mobility-driven circular domains at the Bi/InAs(111) interface, M. C. Richter, J.-M. Mariot, M. A. Gafoor, L. Nicolai, O. Heckmann, U. Djukic, W. Ndiaye, I. Vobornik, J. Fujii, N. Barrett, V. Feyer, C. M. Schneider, K. Hricovini. Surface Science, 651, 147 (2016)
  • Operando X-ray photoelectron emission microscopy for studying forward and reverse biased silicon p-n junctions, N. Barrett, D. M. Gottlob, C. Mathieu, C. Lubin and J. Passicousset, O. Renault and E. Martinez. Review of Scientific Instruments, 87, 053703 (2016)
  • Evolution of defect signatures at ferroelectric domain walls in Mg-doped LiNbO3, G. Nataf, M. Guennou, A. Haussmann, N. Barrett, J. Kreisel. Physica Status Solidi (Rapid Research Letters), 10, 222 (2016)

2015

  • Influence of hole depletion and depolarizing field on the BaTiO3/La0.6Sr0.4MnO3 interface electronic structure revealed by photoelectron spectroscopy and first-principles calculations, D. G. Popescu, N. Barrett, C. Chirila, I. Pasuk and M. A. Husanu. Physical Review B 92, 245442 (2015)
  • Chemistry of surface nanostructures in lead precursor-rich PbZr0.52Ti0.48O3 sol-gel films, I. Gueye, G. Le Rhun, P. Gergaud, O. Renault, E. Defay, N. Barrett Applied Surface Science 363, 21 (2015)
  • Surface atomic and chemical structure of relaxor Sr0.63Ba0.37Nb2O6(001), J. L. Wang, B. Vilquin, B. Gautier, G. Dezanneau and N. Barrett. Applied Physics Letters 106, 242901 (2015)
  • Pattern induced ordering of semiconducting graphene ribbons grown from nitrogen-seeded SiC, F. Wang, G. Liu, S. Rothwell, M.S. Nevius, C. Mathieu, N. Barrett, A. Sala, T.O. Menteş, A. Locatelli, P.I. Cohen, L.C. Feldman, E.H. Conrad Carbon 82, 360 (2015)

2014

  • Reversible switching of in-plane polarized ferroelectric domains in BaTiO3(001) with very low energy electrons, J. E. Rault, T. O. Menteş, A. Locatelli, N. Barrett Scientific Reports 4, 6792 (2014)
  • Enhancement of photovoltaic efficiency by insertion of a polyoxometalate layer at the anode of an organic solar cell, M. Alaaeddine, Q. Zhu, D. Fichou, G. Izzet, J. E. Rault, N. Barrett, A. Proust, L. Tortech Inorganic Chemistry Frontiers 1, 682 (2014)
  • The Bottom-up Growth of Edge Specific Graphene Nanoribbons, M. S. Nevius, F. Wang, C. Mathieu, N. Barrett, A. Sala, T. O. Mentes, A. Locatelli, E. H. Conrad Nano Letters 14, 6080 (2014)
  • Surface polarization, rumpling, and domain ordering of strained ultrathin BaTiO3(001) films with in-plane and out-of-plane polarization , J. Dionot, G. Geneste, C. Mathieu, N. Barrett Physical Review B 90, 014107 (2014)
  • Exploring interlayer Dirac cone coupling in commensurately rotated few-layer graphene on SiC(000-1), C. Mathieu, E. H. Conrad, F. Wang, J. E. Rault, V. Feyer, C. M. Schneider, O. Renault and N. Barrett, Surface and Interface Analysis 46, 1268 (2014)
  • Microscopic work function anisotropy and surface chemistry of 316L stainless steel using photoelectron emission microscopy, N. Barrett, O. Renault, H. Lemaitre, P. Bonnaillie, F. Barcelo, F. Miserque, M. Wang, C. Corbel, Journal of Electron Spectroscopy and Related Phenomena 195, 117 (2014)
  • Charge spill-out and work function of few-layer graphene on SiC(0001), O. Renault, A. Pascon, H. Rotella, K. Kaja, C. Mathieu, J. Rault, P. Blaise, T. Poiroux, N. Barrett, L. Fonseca, Journal of Physics D: Applied Physics 47, 295303 (2014)
  • Electronic structure of Al- and Ga-doped ZnO films studied by hard X-ray photoelectron spectroscopy, M. Gabás, P. Torelli, N. T. Barrett, M. Sacchi, and J. R. Ramos Barrado, APL Materials 2, 012112 (2014)
  • Chemistry and structure of BaTiO3 ultra-thin films grown by different O2 plasma power, J. L. Wang, J. Leroy, G. Niu, G. Saint-Girons, B. Gautier, B. Vilquin, N. Barrett, Chemical Physics Letters 592, 206 (2014)

2013

  • Hydrostatic strain enhancement in laterally confined SiGe nanostripes, G. M. Vanacore1, M. Chaigneau, N. Barrett, M. Bollani, F. Boioli, M. Salvalaglio, F. Montalenti, N. Manini, L. Caramella, P. Biagioni, D. Chrastina, G. Isella, O. Renault, M. Zani, R. Sordan, G. Onida, R. Ossikovski, H.-J. Drouhin, and A. Tagliaferri, Physical Review B 88, 115309 (2013)
  • Polarization Sensitive Surface Band Structure of Doped BaTiO3(001), J. E. Rault, J. Dionot, C. Mathieu, V. Feyer, C. M. Schneider, G. Geneste, and N. Barrett, Physical Review Letters 111, 127602 (2013)
  • Microscopic chemical & electronic structure of few layer graphene on SiC(000-1) C. Mathieu, N. Barrett, PICO, The Omicron Nanoscience Newsletter 17, 6 (2013)
  • Full field electron spectromicroscopy applied to ferroelectric materials, N. Barrett, J. E. Rault, J. L. Wang, C. Mathieu, A. Locatelli, T. O. Mentes, M. A. Niño, S. Fusil, M. Bibes, A. Barthélémy, D. Sando, W. Ren, S. Prosandeev, L. Bellaiche, B. Vilquin, A. Petraru, I. P. Krug and C. M. Schneider, Journal of Applied Physics 113, 187217 (2013)
  • Laboratory-based real and reciprocal space imaging of the electronic structure of few layer graphene on SiC(000-1) using photoelectron emission microscopy, N Barrett, K Winkler, B Krömker and E H Conrad, Ultramicroscopy, 130, 94 (2013)
  • Electrical and physical topography in energy-filtered photoelectron emission microscopy of two-dimensional silicon pn junctions, M. Lavayssière, M. Escher, O. Renault, D. Mariolle and N. Barrett, Journal of Electron Spectroscopy and Related Phenomena 186, 30-38 (2013)
  • Interface electronic structure in a metal/ferroelectric heterostructure under applied bias, J. E. Rault, G. Agnus, T. Maroutian, V. Pillard, Ph. Lecoeur, G. Niu, B. Vilquin, M. G. Silly, A. Bendounan, F. Sirotti and N. Barrett, Physical Review B 87, 155146 (2013)
  • X-ray photoelectron diffraction study of relaxation and rumpling of ferroelectric domains in BaTiO3(001), A. Pancotti, J. Wang, P. Chen, L.Tortech, C.-M. Teodorescu, E. Frantzeskakis and N. Barrett, Physical Review B 87, 184116 (2013)

2012

  • Chemistry and Atomic Distortion at the Surface of an Epitaxial BaTiO3 Thin Film after Dissociative Adsorption of Water, J. L. Wang, F. Gaillard, A. Pancotti, B. Gautier, G. Niu, B Vilquin, V. Pillard, G. L. M. P. Rodrigues and N. Barrett, Journal of Physical Chemistry C 116, 21802-21809 (2012)
  • Polarization dependent chemistry of ferroelectric BaTiO3(001) domains, Y. Mi, G. Geneste, J. E Rault, C. Mathieu, A. Pancotti and N. Barrett, Journal of physics: Condensed matter 24, 275901 (2012)
  • Screening of ferroelectric domains on BaTiO3(001) surface by ultraviolet photo-induced charge and dissociative water adsorption, J. L. Wang, B. Vilquin and N. Barrett, Applied Physics Letters 101, 092902 (2012)
  • Dark field photoelectron emission microscopy of micron scale few layer graphene, N. Barrett, E. Conrad, K. Winkler and B. Krömker, The Review of Scientific Instruments 83, 083706 (2012)
  • Thickness-Dependent Polarization of Strained BiFeO3 Films with Constant Tetragonality, J. Rault, W. Ren, S. Prosandeev, S. Lisenkov, D. Sando, S. Fusil, M. Bibes, A. Barthélémy, L. Bellaiche and N. Barrett, Physical Review Letters 109, 267601 (2012)
  • Expanding the view into complex material systems: From micro-ARPES to nanoscale HAXPES, C. M. Schneider, C. Wiemann, M. Patt, V. Feyer, L. Plucinski, I.P. Krug, M. Escher, N. Weber, M. Merkel, O. Renault and N. Barrett, Journal of Electron Spectroscopy and Related Phenomena 185, 330-339 (2012)

2011

  • Recent Advances In 2D-Band Structure Imaging By k-PEEM and Prospects For Technological Materials, AIP Conference Proceedings 95, 95-99 (2011)
  • Microscopic correlation between chemical and electronic states in epitaxial graphene on SiC(000-1), C. Mathieu, N. Barrett, J. Rault, Y. Mi, B. Zhang, W. A. de Heer, C. Berger, E. Conrad and O. Renault, Physical Review B 83, 235436 (2011)
  • Ferroelectricity in a quasiamorphous ultrathin BaTiO3 film, J. Wang, A. Pancotti, P. Jégou, G. Niu, B. Gautier, Y. Mi, L. Tortech, S. Yin, B. Vilquin and N. Barrett, Physical Review B 84, 205426 (2011)
  • Skin Layer of BiFeO3 Single Crystals, X. Martí, P. Ferrer, J. Herrero-Albillos, J. Narvaez, V. Holy, N. Barrett, M. Alexe and G. Catalan, Physical Review Letters 106, 1-4 (2011)
  • Direct observation of Al-doping-induced electronic states in the valence band and band gap of ZnO films, M. Gabás, P. Torelli, N. Barrett, M. Sacchi, F. Bruneval, Y. Cui, L. Simonelli, P. Díaz-Carrasco and J. Ramos Barrado, Physical Review B 84, 1-4 (2011)
  • Impact of the TiN electrode deposition on the HfO2 band gap for advanced MOSFET gate stacks, C. Gaumer, E. Martinez, S. Lhostis, M.-J. Guittet, M. Gros-Jean, J.-P. Barnes, C. Licitra, N. Rochat, N. Barrett, F. Bertin and A. Chabli, Microelectronic Engineering 88, 72-75 (2011)
  • Photoemission induced bias in two-dimensional silicon pn junctions, M. Lavayssière, O. Renault, D. Mariolle, M. Veillerot, J. P. Barnes, J. M. Hartmann, J. Leroy and N. Barrett, Applied Physics Letters 99, 202107 (2011)

2010

  • Applications of high lateral and energy resolution imaging XPS with a double hemispherical analyser based spectromicroscope, M. Escher, K. Winkler, O. Renault and N. Barrett, Journal of Electron Spectroscopy and Related Phenomena 178-179, 303-316 (2010)
  • Surface enhanced covalency and Madelung potentials in Nb doped SrTiO3 (100), (110) and (111) single crystals, G. M. Vanacore, L. F. Zagonel and N. Barrett, Surface Science 604, 1674-1683 (2010)
  • Influence of the ferroelectric polarization on the electronic structure of BaTiO3 thin films, N. Barrett, J. Rault, I. Krug, B. Vilquin, G. Niu, B. Gautier, D. Albertini, P. Lecoeur and O. Renault, Surface And Interface Analysis 42, 1690-1694 (2010)
  • Extrinsic screening of ferroelectric domains in Pb(Zr0.48Ti0.52)O3, I. Krug, N. Barrett, A. Petraru, A. Locatelli, T. O. Mentes, M. A. Niño, K. Rahmanizadeh, G. Bihlmayer and C. M. Schneider, Applied Physics Letters 97, 222903 (2010)
  • Full field chemical imaging of buried native sub-oxide layers on doped silicon patterns, F. de la Peña, N. Barrett, L. F. Zagonel, M. Walls and O. Renault, Surface Science 604, 1628-1636 (2010)

2009

  • Aspects of lateral resolution in energy-filtered core level photoelectron emission microscopy, A. Bailly, O. Renault, N. Barrett, T. Desrues, D. Mariolle, L. F. Zagonel and M. Escher, Journal of physics: Condensed matter 21, 314002 (2009)
  • Orientation-dependent work function of in situ annealed strontium titanate, L. F. Zagonel, M. Bäurer, A. Bailly, O. Renault, M. Hoffmann, S.-J. Shih, D. Cockayne and N. Barrett, Journal of physics: Condensed matter 21, 314013 (2009)
  • X-ray photoelectron spectroscopy and ultraviolet photoelectron spectroscopy investigation of Al-related dipole at the HfO2/Si interface, L. Q. Zhu, N. Barrett, P. Jégou, F. Martin, C. Leroux, E. Martinez, H. Grampeix, O. Renault and A. Chabli, Journal of Applied Physics 105, 024102 (2009)
  • Spatially resolved, energy-filtered imaging of core level and valence band photoemission of highly p and n doped silicon patterns, N. Barrett, L. F. Zagonel, O. Renault and A. Bailly, Journal of physics: Condensed matter 21, 314015 (2009)
  • Core level photoelectron spectromicroscopy with Al Kα1 excitation at 500nm spatial resolution, O. Renault, M. Lavayssière, A. Bailly, D. Mariolle and N. Barrett, Journal of Electron Spectroscopy and Related Phenomena 171, 68-71 (2009)
  • La spectromicroscopie XPEEM avec le rayonnement synchrotron, N. Barrett and O. Renault, Matériaux et Techniques 97, 101-122 (2009)
  • Chemical and electronic interface structure of spray pyrolysis deposited undoped and Al-doped ZnO thin films on a commercial Cz-Si solar cell substrate, M. Gabás, N. T. Barrett, J. R. Ramos-Barrado, S. Gota, T. C. Rojas and M.C. L’opez-Escalante, Solar Energy Materials and Solar Cells 93, 1356-1365 (2009)

2008

  • Orientation-dependent surface composition of in situ annealed strontium titanate, Luiz F. Zagonel, Nicholas Barrett, Olivier Renault, Aude Bailly, Michael Bäurer, Michael Hoffmann, Shao-Ju Shih and David Cockayne, Surface and Interface Analysis 40, 1709-1712 (2008)
 

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