Single shot spatial coherence characterization of X-ray sources
Most XUV/ X-ray sources, such as HHG and XFEL, exhibit shot to shot variations of spatial coherence. The characterization of the degree of coherence of a beam was, however, until now incompatible with a single shot analysis. Current measurement techniques either require parallel intensity measurements, either the use of several masks.
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We developed a new method which allows a single-shot characterization of the spatial coherence of a beam. The method is based on applying a 2D non-redundant array (NRA) of apertures, designed in a strategic configuration in order to disentangle, simultaneously, the spatial coherence and the intensity distributions. This while allowing for a spatial characterization of the entire light field in a single acquisition. The degree of spatial coherence is retrieved from the Fourier transform of the interferogram, generated by the diffraction of the field through the array. This technique will find scientific applications at several ultrafast laser-based sources as well as X-ray free electron lasers and synchrotrons. |
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| • Collaboration : | Marta Fajardo, Instituto Superior Técnico (Lisbon) | |
| • People : | Joana Duarte | |
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| • Fundings |