X-ray photoemission spectroscopy (XPS) is a very powerful technique that allows investigation of the electronic and geometric properties of materials. Thanks to technical modification of the photoelectron analyzer, it is nowadays possible to couple it with a liquid microjet in order to study liquid samples at the desired pH, concentration of constituents and with a reduced risk of beam damage. In this seminar I will review the technique and present some of the results obtained in the last two years at the Swiss Light Source on liquid/vapour and solid/liquid interfaces.
Laboratory of Surface Science and Technology Department of Materials – ETH Zürich