For PhD students, post-docs, scientists working at European research institutions and young professionals working in material industry:
3rd international school on “Physical and chemical characterization of surfaces at different scales”
in CEA-INSTN and Synchrotron SOLEIL centers,
Paris, on November 16 - 20, 2015.
This school will address different aspects of surface analysis and appropriate analytical techniques in detail, from the most conventional (Raman spectroscopy, AFM/STM, IBA) to the most innovative requiring Synchrotron X-ray (X-ray spectroscopy, X-ray microscopy, X-ray diffraction/Scattering). The complementarity between laboratory and X-ray based techniques will be presented.
A poster session will be organized during the school. The attendees are strongly advised to submit a short abstract.
Deadline for abstract submission and registration is 20 October, 2015.
© Real-time monitoring of growing nanoparticles.
G. Renaud, R. Lazzari, C. Revenant, A. Barbier, M. Noblet, O. Ulrich, F. Leroy, J. Jupille, Y. Borensztein, CR Henry, JP Deville, F. Scheurer, J. Mane-Mane, O. Fruchart