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Univ. Paris-Saclay
2 years of liquid microjet X-ray photoemission spectroscopy at the Swiss Light Source
Laboratory of Surface Science and Technology
Department of Materials - ETH Zürich
Vendredi 29/09/2017, 11:00-12:00
NIMBE Bat 127, p.26, CEA-Saclay

X-ray photoemission spectroscopy (XPS) is a very powerful technique that allows investigation of the electronic and geometric properties of materials. Thanks to technical modification of the photoelectron analyzer, it is nowadays possible to couple it with a liquid microjet in order to study liquid samples at the desired pH, concentration of constituents and with a reduced risk of beam damage. In this seminar I will review the technique and present some of the results obtained in the last two years at the Swiss Light Source on liquid/vapour and solid/liquid interfaces. 

Contact : Patrick GUENOUN


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