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Univ. Paris-Saclay
img Micro-beam of highly charged ions  
imgHighly charged ion beams are a promising tool to probe or modify the surface of materials. In the era of nanometric physics, it becomes useful and necessary to be able to focus these beams on a sub-micrometric scale. A focusing technique by a simple glass “funnel” recently showed all its efficiency with however surprising results (Learning more...) The DRECAM/CIRIL Laboratory and GANIL.
A. Cassimi, dépêche du 02/02/2007


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