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Nick BARRETT

Nick BARRETT

Service de Physique et Chimie des Surfaces et des Interfaces

Laboratoire d'études des nanostructures et d'imagerie de surface (LENSIS)

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Fonction

Directeur de recherche

Chef du groupe photoémission

Représentant du Laboratoire d'études des nanostructures et d'imagerie de surface (LENSIS)

Sujets de recherche

La structure de bandes d’oxydes en particulier développement d’une méthode pour aller au-delà de l’approximation de l’électron libre pour l’état final

La chimie de surface et d’interface
 
L’étude de céramiques nano-structurées et de nano-objets.
 
Le développement de l’imagerie nanospectroscopique avec les microscopes à émission des photoélectrons (XPEEM) constitue le projet instrumental central. L’XPEEM permet d’accéder aux informations spectroscopiques :
  • le travail de sortie
  • l'état chimique
  • la densité d’états
  • la structure de bandes avec une résolution latérale ~100 nm.
 
Cette technique est en conséquence parfaitement adaptée à l’analyse spectroscopique non-destructive de motifs et d’objets à l’échelle des dispositifs technologiques. Pour cela, un travail soutenu est mené sur plusieurs développements instrumentaux les diverses sources d’excitation en conditions de laboratoire pour l’imagerie ; les différents modes de contraste ; l’imagerie filtrée en énergie dans l’espace direct et dans l’espace réciproque.
Enfin un projet ambitieux a démarré pour définir un correcteur d’aberrations sphériques pour la colonne électrostatique, en collaboration avec IFF-9 (Centre de recherche Jülich).

Publications scientifiques

Mes 50 dernières publications (publiCEA) 
 

Thickness-Dependent Polarization of Strained BiFeO3 Films with Constant Tetragonality,
J. E. Rault, W. Ren, S. Prosandeev, S. Lisenkov, D. Sando, S. Fusil, M. Bibes, A. Barthélémy, L. Bellaiche, and N. Barrett, Physical Review Letters 109, 267601 (2012)

Polarization dependent chemistry of ferroelectric BaTiO3(001) domains,
Y. Mi, G. Geneste, J. E. Rault, C. Mathieu, A. Pancotti and N. Barrett, Journal of physics. Condensed matter: an Institute of Physics journal 24, 275901 (2012)

Expanding the view into complex material systems: From micro-ARPES to nanoscale HAXPES,
C. M. Schneider, C. Wiemann, M. Patt, V. Feyer, L. Plucinski, I. P. Krug, M. Escher, N. Weber, M. Merkel, O. Renault, N. Barrett, Journal of Electron Spectroscopy and Related Phenomena 185, 330-339 (2012)

Dark field photoelectron emission microscopy of micron scale few layer graphene,
N. Barrett, E.H. Conrad, K. Winkler, B. Krömker, The Review of Scientific Instruments 83, 083706 (2012)

Chemistry and Atomic Distortion at the Surface of an Epitaxial BaTiO3 Thin Film after Dissociative Adsorption of Water,
J. L. Wang, F. Gaillard, A. Pancotti, B. Gautier, G. Niu, B. Vilquin, V. Pillard, G. L. M. P. Rodrigues, and N. Barrett, Journal of Physical Chemistry C 116, 21802-21809 (2012)

Screening of ferroelectric domains on BaTiO3(001) surface by ultraviolet photo-induced charge and dissociative water adsorption,
J. L. Wang, B. Vilquin and N. Barrett Applied Physics Letters 101, 092902 (2012)

Electrical and physical topography in energy-filtered photoelectron emission microscopy of two-dimensional silicon pn junctions,
M. Lavayssière, N. Barrett, M. Escher, O. Renault, Journal of Electron Spectroscopy and Related Phenomena Accepted (2013)

Full Field electron spectromicroscopy applied to ferroelectric materials,
N. Barrett et al, Journal of Applied Physics, accepted (2013)

Interface Electronic Structure in a Metal/Ferroelectric Heterostructure under Applied Bias,
J. E. Rault, G. Agnus, T. Maroutian, V. Pillard, Ph. Lecoeur, G. Niu, B. Vilquin, M. G. Silly, A. Bendounan, F. Sirotti, and N. Barrett, Physical Review B submitted (2013)

Laboratory-based real and reciprocal space imaging of the electronic structure of few layer graphene on SiC(000-1) using photoelectron emission microscopy, N. Barrett, K. Winkler, B. Krömker, E.H. Conrad, Ultramicroscopy, submitted (2013)

X-ray photoelectron diffraction study of relaxation and rumpling of ferroelectric domains in BaTiO3(001),
A. Pancotti, J. L. Wang, P. Chen, L. Tortech, C.-M. Teodorescu, E. Frantzeskakis, N. Barrett, Physical Review B, submitted (2013)

Dissociative adsorption of H2O on epitaxially strained, out-of-plane polarized, BaTiO3(001) thin films,
J. Wang, N. Barrett, F. Gaillard, G. Niu and B. Vilquin, Physical Chemistry Chemical Physics, submitted (2013)

Thickness-Dependent Polarization of Strained BiFeO3 Films with Constant Tetragonality,
J. E. Rault, W. Ren, S. Prosandeev, S. Lisenkov, D. Sando, S. Fusil, M. Bibes, A. Barthélémy, L. Bellaiche, and N. Barrett, Physical Review Letters 109, 267601 (2012)

Polarization dependent chemistry of ferroelectric BaTiO3(001) domains,
Y. Mi, G. Geneste, J. E. Rault, C. Mathieu, A. Pancotti and N. Barrett, Journal of physics. Condensed matter: an Institute of Physics journal 24, 275901 (2012)

Expanding the view into complex material systems: From micro-ARPES to nanoscale HAXPES,
C. M. Schneider, C. Wiemann, M. Patt, V. Feyer, L. Plucinski, I. P. Krug, M. Escher, N. Weber, M. Merkel, O. Renault, N. Barrett, Journal of Electron Spectroscopy and Related Phenomena 185, 330-339 (2012)

Dark field photoelectron emission microscopy of micron scale few layer graphene,
N. Barrett, E.H. Conrad, K. Winkler, B. Krömker, The Review of Scientific Instruments 83, 083706 (2012)

Chemistry and Atomic Distortion at the Surface of an Epitaxial BaTiO3 Thin Film after Dissociative Adsorption of Water,
J. L. Wang, F. Gaillard, A. Pancotti, B. Gautier, G. Niu, B. Vilquin, V. Pillard, G. L. M. P. Rodrigues, and N. Barrett, Journal of Physical Chemistry C 116, 21802-21809 (2012)

Screening of ferroelectric domains on BaTiO3(001) surface by ultraviolet photo-induced charge and dissociative water adsorption,
J. L. Wang, B. Vilquin and N. Barrett Applied Physics Letters 101, 092902 (2012)

Electrical and physical topography in energy-filtered photoelectron emission microscopy of two-dimensional silicon pn junctions,
M. Lavayssière, N. Barrett, M. Escher, O. Renault, Journal of Electron Spectroscopy and Related Phenomena Accepted (2013)

Full Field electron spectromicroscopy applied to ferroelectric materials,
N. Barrett et al, Journal of Applied Physics, accepted (2013)

Interface Electronic Structure in a Metal/Ferroelectric Heterostructure under Applied Bias,
J. E. Rault, G. Agnus, T. Maroutian, V. Pillard, Ph. Lecoeur, G. Niu, B. Vilquin, M. G. Silly, A. Bendounan, F. Sirotti, and N. Barrett, Physical Review B submitted (2013)

Laboratory-based real and reciprocal space imaging of the electronic structure of few layer graphene on SiC(000-1) using photoelectron emission microscopy,
N. Barrett, K. Winkler, B. Krömker, E.H. Conrad, Ultramicroscopy, submitted (2013)

X-ray photoelectron diffraction study of relaxation and rumpling of ferroelectric domains in BaTiO3(001),
A. Pancotti, J. L. Wang, P. Chen, L. Tortech, C.-M. Teodorescu, E. Frantzeskakis, N. Barrett, Physical Review B, submitted (2013)

Dissociative adsorption of H2O on epitaxially strained, out-of-plane polarized, BaTiO3(001) thin films,
J. Wang, N. Barrett, F. Gaillard, G. Niu and B. Vilquin, Physical Chemistry Chemical Physics, submitted (2013)

Direct observation of Al-doping-induced electronic states in the valence band and band gap of ZnO films
M. Gabas, P. Torelli, N. Barrett, M. Sacchi, F. Bruneval, Y. Cui, L. Simonelli, P. Diaz-Carrasco, J.R. Ramos Barrado, Phys. Rev. B 84, 153303 (2011)

Skin Layer of BiFeO3 Single Crystals
X. Martí, P. Ferrer, J. Herrero-Albillos, J. Narvaez, V. Holy, N. Barrett, M. Alexe, and G. Catalan, Phys. Rev. Lett. 106, 236101 (2011)

Ferroelectricity in a quasiamorphous ultrathin BaTiO3 film
J. L. Wang, A. Pancotti, P. Jégou, G. Niu, B. Gautier, Y.Y. Mi, L. Tortech, S. Yin, B. Vilquin, N. Barrett, Phys. Rev. B 85, 205426 (2011)

Microscopic correlation between chemical and electronic states in epitaxial graphene on SiC(000-1)
C. Mathieu, J. Rault, Y. Mi, B. Zhang, W. A. de Heer, C. Berger, E. Conrad, O. Renault, N. Barrett. Phys. Rev. B 83, 235436 (2011)

Photoemission induced bias in two-dimensional silicon pn junctions
M. Lavayssière,O. Renault, D. Mariolle, M. Veillerot, J. P. Barnes, J. M. Hartmann, J. Leroy, and N. Barrett Appl. Phys. Lett. 99, 202107 (2011)

Recent advances in 2D-band structure imaging by k-PEEM and prospects for technological materials
C. Mathieu, O. Renault, H. Rotella, N. Barrett., A. Chabli. Proc. of FCMN (AIP), 2011.

Extrinisic screening of ferroelectric domains in Pb(Zr0.48Ti0.52)O3
I. Krug, N. Barrett, A. Petraru, A. Locatelli, T.O. Mentes, M.A. Niño, K. Rahmanizadeh, G. Bihlmayer, C.M. Schneider, Appl. Phys. Lett. 97, 222903 (2010)

Applications of high lateral and energy resolution imaging XPS with a double hemispherical analyser based spectromicroscope
M. Escher, K. Winkler, O. Renault, N. Barrett, J. Electr. Spectr. Relat. Phenom. 178-179 303 (2010)

Influence of the ferroelectric polarization on the electronic structure of BaTiO3 thin films
N. Barrett, J. Rault, I. Krug, B. Vilquin, G. Niu, B. Gautier, D. Albertini, P. Lecoeur, O. Renault Surf. Inter. Anal. (2010). DOI: 10.1002/sia.3369

Nanoscale surface chemistry of individual Si nanowires by energy-filtered XPEEM
O. Renault, A. Bailly, L. –F. Zagonel and N. Barrett

Surface enhanced covalency and Madelung potentials in Nb doped SrTiO3 (100), (110) and (111)
G. Vanacore, L.F. Zagonel and N. Barrett, Surf. Sci. 604 1674 (2010).

Full field chemical imaging of buried native sub-oxide layers on doped silicon patterns
F. de la Peña, N. Barrett, L.F. Zagonel, M. Walls, O. Renault, Surf. Sci. 604 1628 (2010).

Direct observation of carrier density at Fermi level in Al doped ZnO films
P. Torelli, M. Gabás, M. Sacchi, N.T. Barrett, L. Simonelli, P. Díaz-Carrasco, J.R. Ramos-Barrado submitted to Appl. Phys. Lett. (2010)

Impact of the TiN electrode deposition on the HfO2 band gap for advanced MOSFETS gate stacks
C. Gaumer, E. Martinez, S. Lhostis, M.-J. Guittet, M. Gros-Jean, J.-P. Barnes, C. Licitra, N. Rochat, N. Barrett, F. Bertin, A. Chabli, Microelectronic Engineering 88, 72 (2011).

XPEEM, une technique d’analyse de surface parfaitement adaptée aux matériaux innovants
N. Barrett, O. Renault Clefs CEA 59, 112 (2010).

X-ray Photoelectron Spectroscopy and Ultraviolet Photoelectron Spectroscopy investigation of Al-related dipole at the HfO2/Si interface
L.Q.Zhu , N.Barrett, P. Jégou, F. Martin, C. Leroux, E. Martinez,  H. Grampeix, O. Renault, A. Chabli  J. Appl. Phys 105 024102 (2009)

X-ray Photoelectron Spectroscopy and Ultraviolet Photoelectron Spectroscopy investigation of Al-related dipole at the HfO2/Si interface
L.Q.Zhu , N.Barrett, P. Jégou, F. Martin, C. Leroux, E. Martinez,  H. Grampeix, O. Renault, A. Chabli February 2, 2009 issue of Virtual Journal of Nanoscale Science & Technology.

X-ray Photoelectron Spectromicroscopy of Doped Silicon Patterns
N. Barrett, M. Lavayssière, L. F. Zagonel, A. Bailly, O. Renault AIP Conference Proceedings 1173 1 (2009)

Spatially-resolved, energy-filtered imaging of core level and valence band photoemission of highly p and n doped silicon patterns
N Barrett, L F Zagonel, O Renault, A Bailly J. Phys. Condens. Matter 21 314015 (2009)

Orientation dependent work function of in situ annealed strontium titanate
L F Zagonel, M Bäurer, A Bailly, O Renault, M Hoffmann, S-J Shih, D Cockayne , N Barrett J. Phys. Condens. Matter 21 314013 (2009)

Aspects of lateral resolution using energy-filtered core-level photoelectron emission microscopy
A Bailly O Renault, N Barrett, T Desrues, D Mariolle, L F Zagonel, and M Escher J. Phys. Condens. Matter 21 314002 (2009)

Chemical and electronic interface structure of spray pyrolysis deposited undoped and Aldoped ZnO thin films on a commercial Cz-Si solar cell substrate
M. Gabas, N.Barrett, J. R. Ramos-Barrado, S. Gota, C. Rojas, M-C Lopez-Escalante Solar Energy Materials and Solar Cells 93 1356 (2009)

La spectromicroscopie XPEEM avec le rayonnement synchrotron
N. Barrett, O. Renault  Matériaux et Techniques 97 101-122 (2009)

Multiple scattering X-ray photoelectron diffraction study of the SrTiO3(100) surface
A. Pancotti, N. Barrett L.F. Zagonel, G. M. Vanacore, J. Appl. Phys. 106 034104 (2009)

Core level photoelectron spectromicroscopy with Al Ka excitation at 500 nm spatial resolution
O. Renault, M. Lavayssière, A. Bailly, D. Mariolle, N. Barrett J. Electr. Spectrosc. Relat. Phenom. 171, 71 (2009)

High resolution photoelectron spectroscopy of Ge/HfO2 gate stacks
O. Renault, E. Martinez, N. Barrett, Elettra Highlights 2006-7, p 44.

High resolution photoelectron spectroscopy of Ge-based HfO2 gate stacks
O. Renault, L. Fourdrinier, E. Martinez, L. Clavelier, and C. Leroyer, N. Barrett, C. Crotti, Appl. Phys. Lett. 90, (2007) 052112.

Photoelectron study of the effect of substrate doping on an HfO2/SiO2/n-Si gate stack
N. Barrett, O. Renault, J.-F. Damlencourt, F. Maccherozzi, M. Fabrizioli, J. Non-Cryst. Solids 353 ( 2007) 635-638.

Band mapping in the one-step photoemission theory: Multi-Bloch-wave structure of final states and interference effects
E. E. Krasovskii, V. N. Strocov, N. Barrett, H. Berger, W. Schattke, and R. Claessen, Phys. Rev. B, 75 (2007) 045432.

Core level photoemission study of nitrided hafnium silicate thin films
N. Barrett, O. Renault, P. Besson, Y. Le Tiec, F. Martin and F. Calvat,  Microelectronic Engineering 84 (2007) 2302-2305.
 
Energy-filtered XPEEM with NanoESCA using synchrotron and laboratory x-ray sources: principles and first demonstrated results
O. Renault, N. Barrett, A. Bailly, L. Zagonel, J. C. Cezar, N. B. Brookes, K. Winkler, B. Krömker, and D. Funnemann, Surf. Sci. 601 (2007) 4727-4732.
 
Band offsets of HfO2/GeON/Ge stacks measured by ultraviolet and soft x-ray photoelectron spectroscopies
E. Martinez, O. Renault, L. Fourdrinier, L. Clavelier, C. Le Royer, C. Licitra, T. Veyron, J. M. Hartmann, V. Loup, L. Vandroux, Appl. Phys. Lett. 90 (2007) 053508.
Investigation on the nature of the chemical link between acetylenic organosilane self-assembled monolayers and Au(1 1 1) by means of synchrotron radiation photoelectron spectroscopy and scanning tunneling microscopy
N. Katsonis, A. Marchenko, D. Fichou and N. Barrett, Surf. Sci. 602 9 (2008).
 
Orientation dependent surface composition of in situ annealed strontium titanate
L.-F. Zagonel, N. Barrett, O. Renault, A. Bailly, M. Bäurer, M. Hoffmann, S.-J. Shih, D. Cockayne soumis à Surf. Inter. Anal. (2007).
 
Changes in macroscopic behaviour through segregation in Niobium doped Strontium Titanate
M. Bäurer, L.-F. Zagonel, N. Barrett, M. Hoffmann J. Phys. Conf. Series à paraître (2008).
 
Premiers résultats en microscopie à émission des photoélectrons avec des rayons X (XPEEM)
N. Barrett, L.-F. Zagonel, Fait marquant IRAMIS-DRECAM
 
Cartographie du travail de sortie de céramiques SrTiO3
N. Barrett, L.-F. Zagonel, Brèves du DRECAM n°161 (revue interne)
 
Local silicon doping as a promoter of patterned electrografting of diazonium for directed surface functionalization
J. Charlier, S. Palacin, J. Leroy, D. Del Frari, L. Zagonel, N. Barrett, O. Renault, A. Bailly, soumis à J. Chem Mater. soumis (2008).
 
Investigating Electronic and Chemical Properties Of HfO2/GeOxNy/Ge  Gate Stacks : High-Resolution Photoelectron Spectroscopy Using Synchrotron Radiation
O. Renault, E. Martinez, L. Fourdrinier, L. Clavelier, C. Le Royer, N. Barrett and C. Crotti, ECS Transactions, vol. 3 n°2 (2006)
 
Three dimensional band structure of layered TiTe2: Photoemission final-state effects
V.N. Strocov, E.E Krasovskii, W. Schattke, N. Barrett, H. Berger, D. Schrupp, R. Claessen, Phys. Rev. B 74 195125 (2006)
 
World Record Resolution in Imaging XPS
O. Renault, N. Barrett, K. Winkler, A. Bailly, B. Krömker, L. Zagonel, D. Funnemann, J.C. Cezar, N. Brookes PICO - Omicron News December (2006)
 
Exchange and correlation effects in electronic excitations of Cu2O
F. Bruneval, N. Vast, L. Reining, M. Izquierdo, F. Sirotti, N. Barrett, Phys. Rev. Lett. 97 267601 (2006)
 
Calcification rate influence on trace element concentrations in aragonitic bivalve shells: Evidences and mechanisms
M. Carré, I. Bentaleb, O. Bruguier, E. Ordinola, N. Barrett, M. Fontugne, Geochimica et Cosmochimica Acta 70 4906 (2006)
 
A comparative XPS and UPS study of VOx layers on mineral TiO2(001)-anatase supports
G. Silversmit, H. Poelman, D. Depla, N. Barrett, G.B. Marin, R. De Gryse
Surf. Interface Anal. 38 1257 (2006)
 
Band offsets of nitrided ultra-thin Hf-silicate films
N. T. Barrett, O. Renault, Y. Le Tiec, P. Besson, F. Martin, Appl. Phys. Lett. 88 162906 (2006)
Modelling the XPS Si 2p core-level intensities of silicon nanocrystals for determination of oxide shell thickness
O. Renault, R. Marlier, N.T. Barrett, E. Martinez, T. Baron, M. Gely, B. de Salvo Surf. Inter. Analy. 38 486 (2006)
 
Reponse to “Comment on ‘Unraveling the conduction mechanism of Al-doped ZnO films by valence band soft X-Ray photoemission spectroscopy
M. Gabás, S. Gota, J. R. Ramos-Barrado, M. Sánchez, N. T. Barrett, J. Avila, M. Sacchi, Appl. Phys. Lett. 86 216102 (2005)
 
Unraveling the conduction mechanism of Al-doped ZnO films by valence band soft X-Ray photoemission spectroscopy
M. Gabás, S. Gota, J. R. Ramos-Barrado, M. Sánchez, N. T. Barrett, J. Avila, M. Sacchi, Appl. Phys. Lett. 86 042104 (2005)
 
Rhinocrotid tooth enamel 18O/16O variability between 23 and 12 Ma in southwestern France
I. Bentaleb, C. Langlois, C. Martin, P. Iacumin, M. Carré, P.-O. Antoine, F. Duranthon, I. Moussa, J.-J. Jaeger, N. Barrett, R. Kandoorp 338 172 Géosciences (2005)
 
Synchrotron radiation x-ray photoelectron spectroscopy of Si nano-crystals grown onto Al2O3/Si surfaces
O. Renault, R. Marlier, M. Gely, B. De Salvo, T. Baron, M. Hansson, N.T. Barrett Appl. Phys. Lett. 87 163119 (2005)
 
A fully oxidized V2O5/TiO2(001)-anatase system studied with in-situ synchrotron photoelectron spectroscopy
G. Silversmit, H. Poelman, D. Depla, D. Poelman, N. Barrett, G.B. Marin, R. De Gryse Surf. Sci. 584 179 (2005).
 
Elastic scattering effects in the electron mean free path in a graphite overlayer studied by photoelectron spectroscopy and LEED
N. Barrett, J.-M. Themlin, E.E. Krasovskii, V.N. Strocov Phys. Rev. B, 71 035427 (2005)
 
Thermal stability of the HfO2/SiO2 interface for sub-0.1 mm CMOS gate oxide stacks : A valence band and quantitative core-level study by soft x-ray photoelectron spectroscopy
N. Barrett, O. Renault, J.-F. Damlencourt, F. Martin J. Appl. Phys. 96 6362 (2004)
 
Elastic scattering effects in the electron mean free path in a graphite overlayer studied by PES and LEED
N. Barrett, E.E. Krasovskii, J.-M. Themlin, V.N. Strocov Surf. Sci. 566 532 (2004)
 
Photoemission study of EuS/PbS electronic structure
B.A Orlowski, E. Guziewicz, B.J. Kowalski, T. Story, S. Mickevicius, A.Y. Sipatov, M. Chernyshova,; I.N. Demchenko, N. Barrett, M. Taniguchi, A. Kimura, H. Sato,; C.A. Sebenne, J.P. Lacharme, R. Medicherla, W. Drube,J. Alloys Comp. 362 198 (2004)
 
Electronics of the SiO2/HfO2 interface by soft x-ray photoemission spectroscopy
O. Renault, N. T. Barrett, D. Samour and S. Quiais-Marthon Surf. Sci 566 526 (2004)
 
Advanced characterization of high-K materials interfaces by high-resolution photoemission using synchrotron radiation
O. Renault, N. Barrett, D. Samour, J.-F. Damlencourt, D. Blin, S. Quiais-Marthon CP683 Characterization and Metrology for ULSI Technology: 2003 International Conference
 
CO adsorption on PtxPd1-x(111) single crystal alloy surfaces : a core level and valence band photoemission study
D. Radosavkic, N. Barrett, R. Belkhou, N. Marsot, C. Guillot Surf. Sci. 516 56-68 (2002)
 
HfO2/SiO2 interface chemistry studied by synchrotron radiation x-ray photoelectron spectroscopy
O. Renault, D. Samour, J.-F. Damiencourt, D. Blin, F. Martin, S. Marthon, N.T. Barrett, P. Besson, Appl. Phys. Lett. 81 3627 (2002)
 
Photoemission from graphite : Intrinsic and Self-energy effects
V.N. Strocov, A. Charrier, J.-M. Themlin, M. Rohlfing, R. Claessen, N. Barrett, J. Avila, J. Sanchez, M.-C. Asensio Phys. Rev. B 64 075105 (2001
 
Electronic properties of -Sn(100)2x1 : Evidence for asymmetric dimer reconstruction
A. Cricenti, P. Perfetti, N. Barrett, C. Guillot, Y.Vu. Aristov, G. Le Lay, Appl. Phys. Lett. 78 3032 (2001)
 
Photoelectron diffraction study on Ge(100) 3d core level
L. Ferrari, M. Pedio, N. Barrett, R. Gunnella, M. Capozi, C.Ottaviani, P. Perfetti Surf. Sci. 482-485 1287 (2001)
 
Photoemission studies of -Sn(100)2×1 surface
G. Le Lay, V.Yu. Aristov, A. Cricenti, P. Perfetti, N. Barret C.Guillot Surf. Sci. 482-485 552 (2001)
 
Ge/Ag(111) semiconductor on metal growth : Formation of an Ag2Ge surface alloy
H. Oughaddou, S. Sawaya, J. Goniakowski, B. Aufray, G. Le Lay, J.M. Gay, G. Tréglia, J.P. Bibérian, JN. Barrett, C. Guillot, A. Mayne, G. Dujardin Phys. Rev. B 62 16653 (2000)
 
Semiconductor on metal adsorption: Ge Tetramers on the Ag(001) surface
H. Oughaddou, B. Aufray, G. Le Lay, J.M. Gay, J.H. Zeysing, R.L. Johnson, N. Barrett, C. Guillot Appl. Surf. Sci. 162-3 74 (2000)
 
Electronic structure of the La-Pt(111) surface alloy
A Ramstad, S. Raaen, N. Barrett Surf. Sci. 448 179 (2000)
 
Structure and growth mode of epitaxial Co/Au(111) magnetic thins films
R. Belkhou, N. Marsot, N. Magnan, P. Le Fèvre, N. Barrett, C. Guillot, D. Chandesris J. Electr. Spectros. Relat. Phenom. 101-103 787 (1999).
 
VUV-Photoelectron spectroscopy of scintillation materials
A.N.Belsky, C.Dujardin, I.Kamenskikh, A.Philippov, C.Guillot, N.Barrett, G.Dujardin, L.Hellner, G.Comtet and C.Pedrin Proc. of the Fifth Int. Conf. on Inorganic Scintillators and their Applications, August 16-20,1999, Moscow State University, Russia
 
From CdTe/Fe Schottky barrier to Cd1-xFexTe semimagnetic semiconductor
B.A. Orlowski, E. Guziewicz, B.J. Kowalski, N. Barrett, R. Belkhou, D. Radosavkic, D. Martinotti, C. Guillot, J.-P. Lacharme, C.A. Sebenne Appl. Surf. Sci. 123/124 631 (1998).
 
From metal-semiconductor junction to ternary alloy crystal
B.A. Orlowski, E. Guziewicz, B.J. Kowalski, N. Barrett, R. Belkhou, D. Radosavkic, D. Martinotti, C. Guillot, J.-P. Lacharme, C.A. Sebenne Electron-Technology. 31 323 (1998).
 
From CdTe/Fe Schottky barrier to Cd1-xFexTe semimagnetic semiconductor
B.A. Orlowski, E. Guziewicz, B.J. Kowalski, N. Barrett, R. Belkhou, D. Radosavkic, D. Martinotti, C. Guillot, J.-P. Lacharme, C.A. Sebenne Appl. Surf. Sci. 123/124 631 (1998).

 

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