| | | | | | | webmail : intra-extra| Accès VPN| Accès IST| Contact | English
Univ. Paris-Saclay
Imaging and spectroscopy of individual atoms in nano-structured materials
Kazu Suenaga
National Institute for Advanced Industrial Science and Technology (AIST) & Japan Science and Technology Corporation (JST)
Mardi 26/06/2012, 10:30
SRMP Bât 520 p.109, CEA-Saclay

“Labeling atom by atom” is an ultimate goal of all kind of analytical techniques. Electron microscopes are widely used to visualize the materials with atomic resolution and have long been contributing extensively to the progress of science and technology. It remains, however, a challenge for scientists to see, to identify and to analyze the individual atoms in nano-structured materials. Especially the low-dimensional materials, such as graphene or nanotube, are known to be affected dramatically their physical and chemical properties by their atomic configurations and their interrupted periodicity, such as defects and edges, are needed to be investigated with atomic precision to predict the future device performance.

Recently the possibilities of chemical and electronic state analysis by means of electron energy-loss spectroscopy (EELS) have been pushed to the single atom limit. We have introduced a low-voltage TEM/STEM which has been developed to realize the single atom imaging and spectroscopy in nano-structured materials (1). Examples for the chemical analysis of individual molecules (2), the single atom spectroscopy at graphene edge (3) and the investigation of individual atomic defects (4, 5) will be presented.

This work is supported by the JST-CREST programme

(1) T. Sasaki et al., J. Electron Microsc. 59 (2010) S7-S13

(2) K. Suenaga et al., Nature Chem. 1 (2009) 415-418

(3) K. Suenaga and M. Koshino, Nature, 468 (2010) 1088-1090

(4) Z. Liu et al., Nature Communications, 2:214 doi:10.1038/ncomms1224 (2011).

(5) K. Suenaga et al., Physical Review Letters, 108 (2012) 075501

Contact : Luc BARBIER


Séminaire SRMP - Informations pratiques

Entrée sur le site du CEA de Saclay pour les séminaires SRMP

Afin de pouvoir entrer sur le site du CEA de Saclay veuillez adresser les données personnelles suivantes par courriel à :
(secrétariat) un avis d’entrée vous sera alors délivré :


Nom :

Prénom :

Date et lieu de naissance :

Nationalité :

Nom de l'employeur :


Ces informations doivent être envoyées au mieux deux jours avant la date du séminaire.>

Lors de votre venue vous devez vous présenter avec une carte d'identité ou un passeport en cours de validité. L'entrée sur le site se fait par l'entrée principale ou porte Nord (suivre le lien ci-dessous), un badge vous y sera remis. Demandez à l'accueil le Bât.520, ils vous renseigneront.
Les séminaires se déroulent au Bât. 520, pièce 109 (1er étage).
En cas de problème vous pouvez contacter le secrétariat au : 01 69 08 51 67

Formalities for entering the CEA Saclay site for SRMP seminars

To enter in CEA Saclay you need to send the following personal data to   (secretariat):

Informations utiles/Practical informations - Contact:

Informations:  Access to the CEA Saclay




Last Name :

First Name :

Place and date of birth :

Nationality :

Employer Name :

These informations must be preferably sent at least two days before the seminar date.


When you come you must have a valid ID card or passport with you.

The entrance in CEA Saclay is through the main entrance or north entrance (see link below), a pass will be delivered. Ask at the “accueil” the path for the building 520. SRMP seminars take place in room 109 (first floor).

Any questions/troubles do not hesitate to contact our secretariat: 33 (0)1 01 69 08 51 67.


#38 - Mise à jour : 11/02/2013


Retour en haut