| Centre
Paris-Saclay
| | | | | | | webmail : intra-extra| Accès VPN| Accès IST | English
Univ. Paris-Saclay
Principles and applications of X-ray Photoemission electron Microscopy
Luiz Zagonel
Groupe Couches Minces d’Oxydes, SPCSI
Vendredi 16/11/2007, 11:00
SPEC Bât 466 p.111 (1er ét.), CEA-Saclay
The development of high energy and spatial resolution x-ray photoemission electron microscopes (XPEEM) provides a new and interesting tool for nanosciences. All the analytical power of photoemission electron spectroscopy is in this way associated with spatial resolution. In this talk this microscope is shown into context and into use. A general overview of analytical microscopes is given with special attention to chemical sensibility. Most applied techniques are described with some relevant comparison information like resolution, acquisition time, chemical sensibility and sample throughput. The XPEEM is inserted in such framework and its particularities are highlighted. At this point the instrumental concept is put into focus and different approaches for energy filtered imaging are discussed with special emphasis on the NanoESCA.Bearing in mind its capabilities, some of the results obtained with the XPEEM illustrate its contribution to some scientific problems. Initially a polymer grafted on metallic multilayer deposited over silicon is discussed as a demonstration of elemental and chemical sensibility in a system with high contrast. Going to the other extreme, a homogenous strontium titanate polycrystal is analysed to discover a particular form of imaging contrast. Following some laborious sample preparation, some breakthrough experiments are proposed to profit all the excellence of this technique. Finally, other contrast methods are explored.The broad application range of energy filtered XPEEM put this instrument in a comfortable position among others in the field. Along side with its use as a routine microscope in some cases, decisive answers can be provided by this technique when its full capacity is exploited.

 

Séminaire SPCSI - Informations pratiques

Entrée sur le site du CEA de Saclay pour les séminaires SPCSI

Afin de pouvoir entrer sur le site du CEA de Saclay veuillez adresser les données personnelles suivantes par courriel à Christine Prigian et Catherine Julien (secrétariat) un avis d’entrée vous sera alors délivré:

 

Nom:

 

 

Prénom:

Date et lieu de naissance:

Nationalité:

Nom de l'employeur:

 

Ces informations doivent être envoyées au mieux deux jours avant la date du séminaire.

Lors de votre venue vous devez vous présenter avec une carte d'identité ou un passeport en cours de validité. L'entrée sur le site se fait par l'entrée principale ou porte Nord (suivre le lien ci-dessous), un badge vous y sera remis. Demandez à l'accueil le Bât.466, ils vous renseigneront.
Les séminaires se déroulent au Bât. 466, pièce 111 (1er étage).
En cas de problème vous pouvez contacter le secrétariat au : 01 69 08 65 32 /  40 12.


Formalities for entering the CEA Saclay site for SPCSI seminars

 

 

To enter in CEA Saclay you need to send the following personal data to Christine  PRIGIAN and Catherine Julien (secretariat):

 

 

Informations utiles/Practical informations - Contact

Informations:  Access



 

Contact: Christine Prigian et Catherine Julien

 

Last Name :

First Name :

Place and date of birth :

Nationality :

Employer Name :

These informations must be preferably sent at least two days before the seminar date.

 

When you come you must have a valid ID card or passport with you.

The entrance in CEA Saclay is through the main entrance or north entrance (see link below), a pass will be delivered. Ask at the “accueil” the path for the building 466. SPCSI seminars take place in room 111 (first floor).

Any questions/troubles do not hesitate to contact our secretariat : 33 (0)1 69 08 65 32 /  40 12.

#28 - Mise à jour : 0000-00-00 00:00:00

 

Retour en haut