Micro-beam of highly charged ions
Highly charged ion beams are a promising tool to probe or modify the surface of materials. In the era of nanometric physics, it becomes useful and necessary to be able to focus these beams on a sub-micrometric scale. A focusing technique by a simple glass “funnel” recently showed all its efficiency with however surprising results (Learning more...)
The DRECAM/CIRIL Laboratory and GANIL.
A. Cassimi, dépêche du 02/02/2007
